Skip to main content
Log in

Microstructural Evolution and Mechanical Properties of Au-20wt.%Sn|Ni Interconnection

  • Published:
Journal of Electronic Materials Aims and scope Submit manuscript

Abstract

In this paper, the microstructural evolution and properties of Au-20wt.%Sn|Ni reaction couples were investigated from two perspectives: (1) by analyzing the microstructure of the as-soldered and aged samples, as well as (2) by measuring the mechanical properties of the intermetallic compounds formed within the reaction zone. The evolution of interfacial reaction products for both the as-soldered and aged interconnections was rationalized by using the experimental results in combination with assessed thermodynamic data from the Au-Ni-Sn system. Moreover, nanoindentation tests were implemented to measure the indentation modulus and hardness of the compounds formed at the interface. It was found that aging had a negligible influence on the elastic modulus and hardness of AuSn and Au5Sn, while the solubility of the third element significantly changed the indentation modulus and hardness of the intermetallic compounds.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. J. Doesburg and D.G. Ivey, Mater. Sci. Eng. B 78, 44 (2000)

    Article  Google Scholar 

  2. D. Kim and C.C. Lee, Mater. Sci. Eng. A 416, 74 (2006)

    Article  Google Scholar 

  3. S. Jin, J. Electron. Mater. 32, 1366 (2003)

    Article  Google Scholar 

  4. V. Vuorinen, H. Dong, H. Xu, S. Vähänen, T. Suni, T. Laurila, and M. Paulasto-Kröckel, Proceedings of the 4th Electronics System-Integration Technology Conference (ESTC) (Amsterdam: IEEE, 2012), p. 1

  5. J.Y. Tsai, C.W. Chang, Y.C. Shieh, Y.C. Hu, and C.R. Kao, J. Electron. Mater. 34, 182 (2005)

    Article  Google Scholar 

  6. J. Yoon, H. Chun, and S. Jung, J. Mater. Res. 22, 1219 (2007)

    Article  Google Scholar 

  7. H.G. Song, J.P. Ahn, and J.W. Morris Jr., J. Electron. Mater. 30, 1083 (2001)

    Article  Google Scholar 

  8. J. Yoon, B. Noh, and S. Jung, J. Mater. Sci. 22, 84 (2011)

    Google Scholar 

  9. X. Wei, Y. Zhang, R. Wang, and Y. Feng, Microelectron. Reliab. 53, 748 (2013)

    Article  Google Scholar 

  10. V. Grolier and R. Schmid-Fetzer, J. Electron. Mater. 37, 815 (2008)

    Article  Google Scholar 

  11. T. Laurila, V. Vuorinen, and M. Paulasto-Kröckel, Mater. Sci. Eng. R 68, 1 (2010)

    Article  Google Scholar 

  12. H. Dong, V. Vuorinen, T. Laurila, and M. Paulasto-Kröckel, Calphad 43, 61 (2013)

    Article  Google Scholar 

  13. J. Ciulik and M.R. Notis, Microelectron. Packag Technol. (Retroactive Cover.) 57 (1989)

  14. F.G. Yost, M.M. Karnowsky, W.D. Drotning, and J.H. Gieske, Metall. Trans. A 21, 1885 (1990)

    Article  Google Scholar 

  15. A. Vicenzo, M. Rea, L. Vonella, M. Bestetti, and P.L. Cavallotti, J. Solid State Electrochem. 8, 159 (2004)

    Article  Google Scholar 

  16. R.R. Chromik, D. Wang, A. Shugar, L. Limata, M.R. Notis, and R.P. Vinci, J. Mater. Res. 20, 2161 (2005)

    Article  Google Scholar 

  17. R. An, C. Wang, and Y. Tian, Electronic Packaging Technology & High Density Packaging. ICEPT-HDP (IEEE, 2008), p. 1

  18. L. Kaufman and H. Bernstein, Computer Calculation of Phase Diagrams with Special Reference to Refractory Metals (New York: Academic Press, 1970)

    Google Scholar 

  19. W.C. Oliver and G.M. Pharr, J. Mater. Res. 7, 1564 (1992)

    Article  Google Scholar 

  20. F.J.J. Van Loo, Prog. Solid State Chem. 20, 47 (1990)

    Article  Google Scholar 

  21. T.F. Page, L. Riester, and S.V. Hainsworth, Fundamentals of Nanoindentation and Nanotribology, Materials Research Society Symposium Proceedings, ed. N.R. Moody, W.W. Gerberich, N. Burnham, and S.P. Baker (Pittsburgh, PA: Materials Research Society 1998), vol. 522, p. 113

    Google Scholar 

  22. D. Chrobak, K. Nordlund, and R. Nowak, Phys. Rev. Lett. 98, 045502 (2007)

    Article  Google Scholar 

  23. A. Leineweber and F. Krumeich, Philos. Mag. 93, 4440 (2013)

    Article  Google Scholar 

  24. H. Xu, A. Rautiainen, V. Vuorinen, E. Österlund, T. Suni, H. Heikkinen, and M. Paulasto-KrÖckel, Electronics System-Integration Technology Conference (ESTC) (Helsinki: IEEE, 2014), p. 1.

  25. A. Rautiainen, H. Xu, E. Österlund, J. Li, V. Vuorinen, and M. Paulasto-KrÖckel, J. Electr. Mater. 44, 4533 (2015).

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to H.Q. Dong.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Dong, H., Vuorinen, V., Liu, X. et al. Microstructural Evolution and Mechanical Properties of Au-20wt.%Sn|Ni Interconnection. J. Electron. Mater. 45, 566–575 (2016). https://doi.org/10.1007/s11664-015-4152-3

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11664-015-4152-3

Keywords

Navigation