Abstract
The effect of water vapor on n-pentanol vapor phase lubrication (VPL) was studied with a microelectromechanical system (MEMS) side-wall tribometer, a pin-on-disc tribometer, and attenuated total reflection infrared (ATR-IR) spectroscopy. The n-pentanol vapor pressure was fixed at 50 % relative to its saturation vapor pressure (P sat = ~2.2 Torr at room temperature), which is sufficient to maintain a monolayer of n-pentanol on a SiO2 surface in a dry Ar environment. As the relative humidity (RH) was increased from zero to 30 %, ATR-IR measurements showed that the water adsorption on the surface increases and the adsorbed pentanol thickness decreases by 60 %. These changes in the adsorption isotherm were manifested as higher, and more scattered friction coefficients observed during the MEMS tribometer operation. The maximum RH tolerance appeared to be 25–30 % RH above which the MEMS tribometer failed to operate reliably. In contrast, the n-pentanol VPL efficiency was not affected significantly during the macro-scale pin-on-disc tribometer tests. These results imply that the friction behavior of the asperity contacts in MEMS is more susceptible to co-adsorption of water than the friction behavior of macro-scale contacts.
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Acknowledgments
This work was financially supported by the National Science Foundation (Grant No. CMMI-1000021) and Sandia National Laboratories. Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.
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Barnette, A.L., Ohlhausen, J.A., Dugger, M.T. et al. Humidity Effects on In Situ Vapor Phase Lubrication with n-Pentanol. Tribol Lett 55, 177–186 (2014). https://doi.org/10.1007/s11249-014-0345-9
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DOI: https://doi.org/10.1007/s11249-014-0345-9