Skip to main content
Log in

Comparing nanotechnology landscapes in the US and China: a patent analysis perspective

  • Perspectives
  • Published:
Journal of Nanoparticle Research Aims and scope Submit manuscript

Abstract

The United States (US) and the People’s Republic of China (China) have the most patents in nanotechnology in their own depositories and overall in the international depositories. This paper compares nanotechnology landscapes between 2001 and 2017 as reflected in the United States Patent and Trademark Office (USPTO) and China National Intellectual Property Administration (CNIPA). It presents the evolution of nanotechnology patent development in the US and China, the differences between nanotechnology topics addressed in the USPTO and CNIPA patents, key players in nanotechnology fields in both domestic and foreign markets, and the player collaboration patterns. Bibliographic, content, and social network analyses are used. The longitudinal changes of granted patents and ranked countries, patent families, technology fields, and key players in domestic and overseas markets are outlined. Collaboration networks of assignees and the influential players have been identified based on network parameters. Results show that the US market attracts more international collaborations and has a higher level of knowledge exchange and resource sharing than the Chinese market. Companies play a vital role with regard to US nanotechnology development, resulting in more within-industry collaborations. In contrast, universities and research institutes are the dominant contributors to China’s nanotechnology development, leading to more academia-industry collaborations in China’s market.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6

Similar content being viewed by others

Notes

  1. Available on https://www.questel.com/software/ipbi/orbit-intelligence (more information at: http://www.questel.com/communication/data-at-a-glance.pdf; https://www.questel.com/software/data-coverage/)

  2. Defined by WIPO International Patent Classification (IPC) and technology concordance (Schmoch 2008).

  3. Available on https://gephi.org/users/download/

  4. The Paris Convention for the Protection of Industrial Property. Available on https://www.wipo.int/treaties/en/ip/paris/

  5. Patent examples of each topic are detailed in Tables 15 and 16 (Appendix).

References

Download references

Acknowledgments

This research was supported by the National Science Foundation under Grant No. NSF EFMA-1832926, the National Social Science Fund of China under Grant No. 15BGL037, and the National Natural Science Foundation of China under Grant No. 71673135. The fourth co-author was supported by the Directorate for Engineering in NSF. The authors thank Questel.com for making patent database available for research and Qingmin Ji at Herbert Gleiter Institute of Nanoscience at Nanjing University of Science and Technology for her help in validating nanotechnology topics and keywords. The opinions expressed here are those of the authors and do not necessarily reflect the position of the respective supporting agencies.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Hongyi Zhu.

Ethics declarations

Conflict of interest

The authors declare that they have no conflict of interest.

Additional information

Publisher’s note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Appendix

Appendix

Table 12 Search results of nanotechnology keywords
Table 13 Technology fields in the USPTO
Table 14 Technology fields in the CNIPA
Table 15 Topics and patent examples in the USPTO
Table 16 Topics and patents examples in the CNIPA

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Wu, L., Zhu, H., Chen, H. et al. Comparing nanotechnology landscapes in the US and China: a patent analysis perspective. J Nanopart Res 21, 180 (2019). https://doi.org/10.1007/s11051-019-4608-0

Download citation

  • Received:

  • Accepted:

  • Published:

  • DOI: https://doi.org/10.1007/s11051-019-4608-0

Keywords

Navigation