Abstract
Varying amounts of Na and K doped lanthanum–titanium oxides were synthesized by gel entrapment technique. These ceramics were characterized by X-ray diffraction. Microstructural investigations revealed grain growth in the doped material compared to undoped sample. Dielectric relaxations of these compounds were investigated in the temperature range 250–900 °C. A high degree of dispersion of the permittivity of un-doped lanthanum–titanium oxide and K and Na doped lanthanum–titanium oxide was observed in the frequency range <100 kHz which was attributed to oxygen vacancies. An increase in the permittivity values were observed with 1 % Na and K doped samples. The permittivity values further deteriorated with the dopant concentration. Using the Cole–Cole model, an analysis of the dielectric loss with frequency was performed, assuming a distribution of relaxation time. The dielectric loss was found to decrease by doping K in lanthanum–titanium oxide matrix. The dc conductivity studies showed that a temperature dependent hopping type mechanism is responsible for electrical conduction in the system.
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Acknowledgments
The authors wish to express their sincere thanks to Dr. S. K. Aggarwal, Head, Fuel Chemistry Division, BARC for his constant encouragement. We also express our gratitude to Dr. N. D. Dahale of FCD, BARC for his support in carrying out the XRD analysis.
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Pai, R.V., Bhattacharya, S., Mukerjee, S.K. et al. Electrochemical characterization of sodium and potassium doped lanthanum–titanium mixed oxides prepared by sol–gel method. J Sol-Gel Sci Technol 72, 455–463 (2014). https://doi.org/10.1007/s10971-014-3456-8
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DOI: https://doi.org/10.1007/s10971-014-3456-8