Abstract
In this work, Fe/Sn diffusion couples were manufactured to study the growth behavior and kinetic parameters of intermetallic compounds (IMCs). The diffusion couples were aged at four temperatures, namely at T = 300, 350, 400, and 500 °C, for various times up to 14,400 s. EPMA and XRD were carried out to study the Fe/Sn interface. The layer of IMCs consisted of only FeSn2 with an irregular microstructure. The growth of IMC layer predominantly took place in the Sn specimen. The mean thickness of the layer was proportional to the power function of the aging time. The growth exponent was close to 0.5 at T = 400 and 500 °C, taking values of 0.479 and 0.503, respectively. Hence, the volume diffusion was the rate-controlling process for the layer growth of IMCs at 400–500 °C. The growth exponent was equal to 0.422 at T = 350 °C and 0.406 at T = 300 °C. Herein, the grain boundary diffusion and volume diffusion contributed to the rate-controlling process. The growth rate constant, K0, was 3.114 × 10−10 m2 s−1 and activation energy was 46.76 kJ mol−1. A mathematical model was established to predict the thickness of IMCs layer as a function of aging time and aging temperature by using Arrhenius equation and including a growth correction factor, ycoor. The prediction results were consistent with the experimental results.
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References
T.L. Yang, J.Y. Wu, C.C. Li, S. Yang, C.R. Kao, Low temperature bonding for high temperature applications by using SnBi solders. J. Alloys Compd. 647, 681–685 (2015)
C.K. Chung, Y.J. Chen, C.C. Li, C.R. Kao, The critical oxide thickness for Pb-free reflow soldering on Cu substrate. Thin Solid Films 520(16), 5346–5352 (2012)
L. Zhang, L. Sun, Y.H. Guo, Microstructures and properties of Sn58Bi, Sn35Bi0.3Ag, Sn35Bi1.0Ag solder and solder joints. J. Mater. Sci. 26(10), 7629–7634 (2015)
Y.J. Hu, Y.C. Hsu, C.T. Lu, T.S. Huang, C.Y. Chen, W.N. Chuang, C.Y. Hsiao, C.P. Lin, C.Y. Liu, Interfacial reactions between columnar or layered Ni(P) layers and Sn–Ag–Cu solder. J. Electron. Mater. 43(1), 277–283 (2014)
B. Horvath, B. Illes, T. Shinohara, Growth of intermetallics between Sn/Ni/Cu, Sn/Ag/Cu and Sn/Cu layered structures. Thin Solid Films 556, 345–353 (2014)
Y. Yang, J.N. Balaraju, Y.Z. Huang, H. Liu, Z. Chen, Interface reaction between an electroless Ni–Co–P metallization and Sn–3.5Ag lead-free solder with improved joint reliability. Acta Mater. 71, 69–79 (2014)
H.F. Zou, Q.K. Zhang, Z.F. Zhang, Interfacial microstructure and mechanical properties of SnBi/Cu joints by alloying Cu substrate. Mater. Sci. Eng., A 532, 167–177 (2012)
X.W. Hu, Y.L. Li, K. Li, Z.X. Min, Effect of Bi segregation on the asymmetrical growth of Cu–Sn intermetallic compounds in Cu/Sn–58Bi/Cu sandwich solder joints during isothermal aging. J. Electron. Mater. 42(12), 3567–3572 (2013)
S. Vaynman, S.A. McKeown, Energy-based methodology for the fatigue life prediction of solder materials. IEEE Trans. Compon. Hybrids Manufact. Technol. 16(3), 317–322 (1993)
Y. Tang, S.M. Luo, Z.H. Li, C.J. Hou, G.Y. Li, Morphological evolution and growth kinetics of interfacial Cu6Sn5 and Cu3Sn layers in low-Ag Sn–0.3Ag–0.7Cu–xMn/Cu solder joints during isothermal ageing. J. Electron. Mater. 47(10), 5913–5929 (2018)
Y. Tanaka, M. Kajihara, Kinetics of isothermal reactive diffusion between solid Fe and liquid Al. J. Mater. Sci. 45(20), 5676–5684 (2010)
M. O, T. Suzuki, M. Kajihara, Kinetics of isothermal reactive diffusion between solid Cu and liquid Sn. J. Electron. Mater. 47(1), 18–26 (2018)
P.T. Vianco, P.F. Hlava, A.C. Kilgo, Intermetallic compound layer formation between copper and hot-dipped 100IN, 50IN-50SN, 100SN, and 63SN-37 PB coatings. J. Electron. Mater. 23(7), 583–594 (1994)
W.K. Choi, J.H. Kim, S.W. Jeong, H.M. Lee, Interfacial microstructure and joint strength of Sn–3.5 Ag–X (X = Cu, In, Ni) solder joint. J. Mater. Res. 17(1), 43–51 (2002)
B.L. Chen, G.Y. Li, An investigation of effects of Sb on the intermetallic formation in Sn–3.5 Ag–0.7 Cu solder joints. IEEE Trans. Compon. Packag. Technol. 28(3), 534–541 (2005)
X. Li, W.J. Zhang, IEEE, A novel statistical distortion model of mpeg-4 FGS, IEEE, New York, 2005
X.J. Ding, D.L. Wang, L. Zhang, L.H. Chen, W.J. Zhang, Kirkendall voids evolution in Sn–Ag–In solder bumps and its effect on reliability (IEEE, New York, 2016)
M. Singh, S. Bhan, Contribution to the Fe–Sn system. J. Mater. Sci. Lett. 5(7), 733–735 (1986)
A. Furuto, M. Kajihara, Numerical analysis for kinetics of reactive diffusion controlled by boundary and volume diffusion in a hypothetical binary system. Mater. Trans. 49(2), 294–303 (2008)
G.Y. Li, X.D. Bi, Q. Chen, X.Q. Shi, Influence of dopant on growth of intermetallic layers in Sn–Ag–Cu solder joints. J. Electron. Mater. 40(2), 165–175 (2011)
Y.L. Corcoran, A.H. King, N. Delanerolle, B. Kim, Grain-boundary diffusion and growth of titanium silicide layers on silicon. J. Electron. Mater. 19(11), 1177–1183 (1990)
T. Yamada, K. Miura, M. Kajihara, N. Kurokawa, K. Sakamoto, Formation of intermetallic compound layers in Sn/Au/Sn diffusion couple during annealing at 433 K. J. Mater. Sci. 39(7), 2327–2334 (2004)
T. Yamada, K. Miura, M. Kajihara, N. Kurokawa, K. Sakamoto, Kinetics of reactive diffusion between Au and Sn during annealing at solid-state temperatures. Mater. Sci. Eng. A 390(1–2), 118–126 (2005)
Y. Muranishi, M. Kajihara, Growth behavior of Nb 3Sn layer during reactive diffusion between Cu–8.3Sn alloy and Nb. Mater. Sci. Eng., A 404(1–2), 33–41 (2005)
M. Kajihara, Analysis of kinetics of reactive diffusion in a hypothetical binary system. Acta Mater. 52(5), 1193–1200 (2004)
M. Kajihara, Temperature dependence of kinetics for reactive diffusion in a hypothetical binary system. Mater. Trans. 46(10), 2142–2149 (2005)
A. Lis, M.S. Park, R. Arroyave, C. Leinenbach, Early stage growth characteristics of Ag3Sn intermetallic compounds during solid–solid and solid–liquid reactions in the Ag–Sn interlayer system: experiments and simulations. J. Alloys Compd. 617, 763–773 (2014)
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Wang, X., Li, D., Li, N. et al. Growth behavior of intermetallic compounds in Fe/Sn diffusion couples. J Mater Sci: Mater Electron 30, 12639–12646 (2019). https://doi.org/10.1007/s10854-019-01627-z
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DOI: https://doi.org/10.1007/s10854-019-01627-z