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Novel insights in growth of intermetallic compounds between Sn–3.0Ag–0.5Cu solder and flexible PCB substrates under strain

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Abstract

The study investigated the effect of tensile and compressive strain on the interfacial reaction of SAC305/Cu system. Experimental results indicated that the thickness of Cu6Sn5 layer on non-strained samples slightly decreased after aging for 120 h and increased with prolonged aging time. The applied tensile strain had an enhanced effect on the growth of Cu6Sn5 phase, while the applied compressive strain inhibited the growth of Cu6Sn5 phase. However, the thickness of Cu3Sn layer at SAC305/Cu solder joints increased gradually with increasing aging time, regardless of whether strain was or not applied on the solder joints. Besides, the mean diameter of Cu6Sn5 grain increased in three systems as the aging time was prolonged to 480 h. The morphology of Cu6Sn5 grain on non-strained samples gradually changed from round-shape into polyhedron-shape with increased aging time. The morphology of Cu6Sn5 grain under tensile or compressive strain was polyhedron-shape. The Kirkendall voids appeared within Cu3Sn layer in three systems after aging for 120 h and the amount of voids increased gradually with prolonged aging time. The applied tensile or compressive strain had an enhanced effect on the formation of voids within Cu3Sn layer and the enhanced effect of applied tensile strain was much remarkable than that of other systems.

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Acknowledgements

This work was supported by the National Natural Science Foundation of China (Grant No. 51765040), Natural Science Foundation of Jiangxi Province (Grant No. 20161BAB206122) and Postgraduate Innovation special founds of Jiangxi Province (Grant No. YC2018-S060).

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Authors and Affiliations

  1. Key Lab for Robot & Welding Automation of Jiangxi Province, Mechanical & Electrical Engineering School, Nanchang University, Nanchang, 330031, People’s Republic of China

    Xudong Zhang, Xiaowu Hu, Xiongxin Jiang & Liuru Zhou

  2. State Key Laboratory of Advanced Processing and Recycling of Nonferrous Metals, Lanzhou University of Technology, Lanzhou, 730050, People’s Republic of China

    Qinglin Li

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  1. Xudong Zhang
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  2. Xiaowu Hu
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  3. Xiongxin Jiang
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Correspondence to Xiaowu Hu.

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Zhang, X., Hu, X., Jiang, X. et al. Novel insights in growth of intermetallic compounds between Sn–3.0Ag–0.5Cu solder and flexible PCB substrates under strain. J Mater Sci: Mater Electron 30, 9410–9420 (2019). https://doi.org/10.1007/s10854-019-01271-7

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