Abstract
In this paper, the energy distribution of trapped charges on the surface of cross-linked polyethylene (XLPE) thermally aged at 100 °C and 160 °C were studied by the isothermal surface potential decay method. It was found that the surface traps of unaged XLPE were mainly deep ones of both electron-type and hole-type. In the process of thermal aging at 100 °C, the surface traps of XLPE were still mainly deep traps. As the aging time increased, the density of shallow traps increased, and the density of deep traps didn’t change much. In the process of thermal aging at 160 °C, the density of shallow traps of both electron-type and hole-type ones increased greatly, and the density of deep traps of both electron-type and hole-type ones decreased sharply. At the same time, the energy levels of hole-type traps decreased. Under the thermal stress, the increase in the density of shallow traps may be due to an increase in aging products such as carbonyl (C=O); the decrease in the density of deep traps should be due to a decrease in chemical defects in the crystalline regions because of the destruction of spherulites. Differences of the energy distribution of trapped charges on the surface of XLPE aged at two different temperatures may be caused by the differences in the way that crystal structures deteriorate.
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G.C. Montanari, G. Mazzanti, F. Palmieri, A. Motori, G. Perego, S. Serra, Space-charge trapping and conduction in LDPE, HDPE and XLPE. J. Phys. D Appl. Phys. 34(18), 2902–2911 (2001)
T.C. Zhou, G. Chen, R.J. Liao, Z.Q. Xiu, Charge trapping and detraping in polymeric materials: trapping parameters. J. Appl. Phys. 110, 0437241–0437246 (2011)
L.A. Dissado, G. Mazzanti, G.C. Montanari, The role of trapped space charges in the electrical aging of insulating materials. IEEE Trans. Dielectr. Electr. Insul. 4, 496–506 (1997)
R. Liu, T. Takada, N. Takasu, Pulsed electro-acoustic method for measurement of space charge distribution in power cables under both DC and AC electric fields. J. Phys. D Appl. Phys. 26(6), 986–993 (1993)
Y.W. Zhang, J. Lewiner, C. Alquie, N. Hampton, Evidence of strong correlation between space-charge bulidup and breakdown in cable insulation. IEEE Trans. Dielectr. Electr. Insul. 3(6), 778–783 (1997)
N.H. Ahmed, N.N. Srinivas, Review of space charge measurement in dielectrics. IEEE Trans. Dielectr. Electr. Insul. 4(5), 644–656 (1997)
Y.F.F. Ho, G. Chen, A.E. Davies, Measurement of space charge in XLPE insulation under 50 Hz ac electric stresses using the LIPP method. IEEE Trans. Dielectr. Electr. Insul. 9(3), 362–370 (2002)
B.B. Sauer, P. Avakian, H.W. Starkweather, Thermally stimulated current and dielectric studies of poly(aryl ether ketone ketone). Macromoleculesl. 23(24), 5119–5126 (1990)
T.J. Sonnonstine, M.M. Perlman, Surface potential decay in insulators with field dependent mobility and injection efficiency. J. Appl. Phys. 46(9), 3975–3981 (1975)
W.W. Shen, H.B. Mu, G.J. Zhang, J.B. Deng, T.D. Min, Identification of electron and hole trap based on isothermal surface potential decay model. J. Appl. Phys. 113, 0837061–0837066 (2013)
J.Y. Li, H. Li, F.S. Zhou, S.H. Wang, J.K. Zhao, B.H. Ouyang, Copper-catalyzed oxidation caused by copper-rich impurities in cross-linked polyethylene cable insulation. J. Mater. Sci. Mater. Electron. 27(1), 806–810 (2016)
H. Li, J.Y. Li, Y.X. Ma, Q.M. Yan, B.H. Ouyang, The role of thermo-oxidative aging at different temperatures on the crystal structure of crosslinked polyethylene. J. Mater. Sci. Mater. Electron. 29, 3696–3703 (2018)
A. Tzimas, S.M. Rowland, L.A. Dissado, Effect of electrical and thermal stressing on charge traps in XLPE cable insulation. IEEE Trans. Dielectr. Electr. Insul. 19(6), 2145–2154 (2012)
X. Wang, D. Tu, Y. Tanaka, T. Muronaka, T. Takada, C. Shinoda, T. Hashizumi, Space charge in XLPE power cable under DC electrical stress and heat treatment. IEEE Trans. Dielectr. Electr. Insul. 2(3), 467–474 (1995)
P. Cartensen, A. Furkas, A. Campus, U.H. Nilsson, The effect of the thermal history on the space charge accumulation in HVDC cross-linked polyethylene cables, in IEEE International Conference Electrical Insulation Dielectric Phenomena (CEIDP), Nashville, TN, USA, pp. 381–388 (2005)
L. Boudou, V. Griseri, J. Guastavino, L.A. Dissado, Effect of temperature on space charge formation in low density polyethylene—role of antioxidant, in IEEE International Conference on Solid Dielectrics, Toulouse, France, pp. 252–255 (2004)
M. Abou-Dakka, A. Bulinski, S. Bamji, Effect of additives on the performance of cross-linked polyethylene subjected to long term single and periodically reversed polarity DC voltage. IEEE Trans. Dielectr. Electr. Insul. 20(2), 654–663 (2013)
K. Terashima, H. Sukuki, M. Hara, Research and development of ± 250 kV DC XLPE cables. IEEE Trans. Power. Deliv. 13(1), 7–16 (1998)
H. Li, J.Y. Li, W.W. Li, X.T. Zhao, G.L. Wang, Fractal analysis of side channels for breakdown structures in XLPE cable insulation. J. Mater. Sci. Mater. Electron. 24(5), 1640–1643 (2013)
J.Y. Li, H. Li, Q.M. Wang, X. Zhang, B.H. Ouyang, J.K. Zhao, Accelerated inhomogeneous degradation of XLPE insulation caused by copper-rich impurities at elevated temperature. IEEE Trans. Dielectr. Electr. Insul. 23(3), 1789–1797 (2016)
J.Y. Li, F.S. Zhou, D.M. Min, S.T. Li, R. Xia, The energy distribution of trapped charges in polymers based on isothermal surface potential decay model. IEEE Trans. Dielectr. Electr. Insul. 22(3), 1723–1732 (2015)
M. Meunier, N. Quirke, A. Aslanides, Molecular modeling of electron traps in polymer insulators: chemical defects and impurities. J. Chem. Phys. 115(6), 2876–2881 (2001)
G. Teyssedre, C. Laurent, A. Aslanides, Deep trapping centers in crosslinked polyethylene investigated by molecular modeling and luminescence techniques. IEEE Trans. Dielectr. Electr. Insul. 8(5), 744–752 (2001)
A. Huzayyin, S. Boggs, R. Ramprasad, Density functional analysis of chemical impurities in dielectric polyethylene. IEEE Trans. Dielectr. Electr. Insul. 17(3), 926–930 (2010)
J.P. Jones, J.P. Llewellyn, T.J. Lewis, The contribution of field-induced morphological change to the electrical aging and breakdown of polyethylene. IEEE Trans. Dielectr. Electr. Insul. 12(5), 951–966 (2005)
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Li, H., Zhai, S., Hu, L. et al. The energy distribution of trapped charges on the surface of cross-linked polyethylene thermally aged at different temperatures. J Mater Sci: Mater Electron 30, 9015–9021 (2019). https://doi.org/10.1007/s10854-019-01230-2
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DOI: https://doi.org/10.1007/s10854-019-01230-2