Abstract
Sn–Ag–Cu based solder alloys are replacing Sn–Pb solders in electronic packaging structures of commercial electric devices. In order to evaluate the structural reliability, the mechanical property of solder material is critical to the numerical simulations. Annealing process has been found to stabilize material properties of Sn–37Pb solder material. In the current study, the annealing effect on tensile behaviour of Sn–3.0Ag–0.5Cu (SAC305) solder material is investigated and compared with Sn–37Pb solder. It is found that the tensile strength for both materials are more stabilized and consistent after the annealing process, nevertheless, the annealing process will improve the plasticity of SAC305 solder dominated by dislocation motion, and impede the occurrence of hardening deformation in Sn–37Pb solder dominated by grain-boundary sliding mechanism. Furthermore, the annealing effect is quantified in the proposed constitutive model based on unified creep–plasticity theory. The parameters are calibrated against the measured stress–strain relationships at the tensile strain rates ranging from 1 × 10−4 to 1 × 10−3 s−1. The numerical regressions for dominant parameters in the proposed model reveal the intrinsic differences between SAC305 and Sn–37Pb solders under annealing treatment.
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References
M. Osterman, Being “RoHS Exempt” in a Pb-free world (University of Maryland, College Park, 2006)
I.C. Turner, B.D. Dunn, C. Barnes, Solder. Surf. Mt. Technol. 25, 218–228 (2013)
B.D. Dunn, G. Mozdzen, Solder. Surf. Mt. Technol. 26, 139–146 (2014)
H. Ma, J.C. Suhling, J. Mater. Sci. 44, 1141–1158 (2009)
X. Long, X. He, Y. Yao, J. Mater. Sci. 52, 6120–6137 (2017)
S. Wang, Y. Yao, X. Long, J. Mater. Sci.-Mater. Electron. 28, 17682–17692 (2017)
J.W. Jang, A.P.D. Silva, J.K. Lin, D.R. Frear, J. Mater. Res. 19, 1826–1834 (2004)
T.Y. Lee, W.J. Choi, K.N. Tu, J.W. Jang, S.M. Kuo, J.K. Lin, D.R. Frear, K. Zeng, J.K. Kivilahti, J. Mater. Res. 17, 291–301 (2011)
J. Wang, X. Long, Y. Yao, J. Mater. Sci.-Mater. Electron. 28, 14884–14892 (2017)
X. Long, S. Wang, X. He, Y. Yao, J. Mater. Res. 32, 3089–3099 (2017)
Directive EU, European Parliament legislative resolution of 24 November 2010 on the proposal for a directive of the European Parliament and of the Council on the restriction of the use of certain hazardous substances in electrical and electronic equipment (A7-0196/2010, 2010)
Y.C. Chan, D. Yang, Prog. Mater. Sci. 55, 428–475 (2010)
Y. Yao, X. Long, L.M. Keer, Appl. Mech. Rev. 69, 040802 (2017)
X. Long, Y. Yao, Y. Wu, W. Xia, L. Ren, International Conference on Electronic Packaging Technology (ICEPT), Harbin 2017, pp. 63–68
F. Qin, T. An, N. Chen, J. Appl. Mech. 77, 1008 (2010)
N. Bai, X. Chen, Int. J. Plasticity 25, 2181–2203 (2009)
Annual Book of ASTM Standards, Standard test methods for tension testing of metallic materials (American Association State, West Conshohocken, 2009)
H. Ma, J. Mater. Sci. 44, 3841–3851 (2009)
F. Ochoa, J.J. Williams, N. Chawla, J. Electron. Mater. 32, 1414–1420 (2003)
N. Bai, X. Chen, H. Gao, Mater. Design. 30, 122–128 (2009)
G. Xiao, G. Yuan, C. Jia, X. Yang, Z. Li, X. Shu, Mater. Sci. Eng. A 613, 336–339 (2014)
X. Long, S. Wang, Y. Feng, Y. Yao, L.M. Keer, Mater. Sci. Eng. A 696, 90–95 (2017)
X. Long, Y. Feng, Y. Yao, Int. J. Appl. Mec. 9, 1750057 (2017)
Y. Yao, L.M. Keer, M.E. Fine, Intermetallics 18, 1603–1611 (2010)
X. Chen, G. Chen, Mater. Design. 28, 85–94 (2007)
Y. Yao, X. He, L.M. Keer, M.E. Fine, Acta Mater. 83, 160–168 (2015)
Y. Yao, L.M. Keer, Microelectron. Reliab. 53, 629–637 (2013)
F. Dunne, N. Petrinic, Introduction to computational plasticity. (Oxford University Press, Oxford, 2005)
S. Wen, L.M. Keer, H. Mavoori, J. Electron. Mater. 30, 1190–1196 (2001)
Dassault Systemes Simulia Corp., ABAQUS User’s Manual 6.14-4 (Hibbitt, Karlsson & Sorensen, Rhode Island, 2014)
T. Siewert, S. Liu, D.R. Smith, J.C. Madeni, Database for solder properties with emphasis on new lead-free solders, Colorado (2002)
P. Lall, D. Zhang, V. Yadav, D. Locker, Microelectron. Reliab. 62, 4–17 (2016)
M. Maleki, J. Cugnoni, J. Botsis, Mater. Sci. Eng. A 661, 132–144 (2016)
Acknowledgements
The authors are grateful for the supports provided by the National Natural Science Foundation of China (Nos. 51508464 and 11572249), the Natural Science Foundation of Shaanxi Province (No. 2017JM1013), the Fundamental Research Funds for the Central Universities (No. 3102016ZY017), and the Astronautics Supporting Technology Foundation of China (No. 2017-HT-XG).
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Long, X., Tang, W., Wang, S. et al. Annealing effect to constitutive behavior of Sn–3.0Ag–0.5Cu solder. J Mater Sci: Mater Electron 29, 7177–7187 (2018). https://doi.org/10.1007/s10854-018-8705-0
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DOI: https://doi.org/10.1007/s10854-018-8705-0