Abstract
The open circuit voltage (VOC) is a critical and common indicator of solar cell performance as well as degradation, for panel down to lab-scale photovoltaics. Detecting VOC at the nanoscale is much more challenging, however, due to experimental limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, an approach based on Conductive Atomic Force Microscopy is implemented to directly detect the local VOC, notably for monocrystalline Passivated Emitter Rear Contact (PERC) cells which are the most common industrial-scale solar panel technology in production worldwide. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-aluminum-silicide via through the rear emitter. The VOC maps reveal a local back surface field extending ~ 2 μm into the underlying p-type Si absorber due to Al in-diffusion as designed. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for directly visualizing the effects of processing parameters, as well as identifying signatures of degradation for silicon and other solar cell technologies.
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Acknowledgement
This material is based upon work supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number DE-EE-0008172. The DuPont Silicon Valley Technology Center is recognized for fabricating the investigated monocrystalline PERC cells, including Shannon Dugan and Joe Scardera for details on the cell processing and providing Fig. 4c.
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Longacre, A., Martin, M., Moran, T. et al. Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells. J Mater Sci 55, 11501–11511 (2020). https://doi.org/10.1007/s10853-020-04736-x
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DOI: https://doi.org/10.1007/s10853-020-04736-x