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Conduction through plasma-treated polyimide: analysis of high-field conduction by hopping and Schottky theory

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Abstract

Plasma surface modification of polyimide (PI) films has been used to modify the material’s wetting and adhesion properties but has also been found to impact high-field electrical properties. Previous work by Meddeb et al. (Chem Phys Lett 649:111–114, 2016. https://doi.org/10.1016/j.cplett.2016.02.037) demonstrates a significant reduction in high-field leakage current at high temperatures because of O2 plasma treatment of PI. In this study, we investigate field-dependent current density [J(E)] data measured in our previous study by Meddeb et al. (2016) to identify the surface and bulk mechanisms responsible for high-field conduction behavior of O2 plasma-modified PI films. Specifically, we analyze the J(E) data using three conduction theories: Poole–Frenkel, Schottky, and Hopping. Poole–Frenkel and Schottky analyses are performed by the implementation of linear regression. Hopping analysis was performed using a rigorous statistical technique that incorporates nonlinear regression as well as a bootstrap statistical analysis of fit parameters. Analysis of J(E) data over the temperature range 25–175 °C indicates that 13-micron-thick untreated PI films are dominated by a hopping process at lower temperatures; however, transition to Schottky-dominated conduction occurs as temperature is increased. Films treated with O2 plasma show similar characteristics to the untreated set: Hopping dominated conduction at low temperatures with gradual transition to Schottky. However, the transition to Schottky conduction occurs at a higher temperature in plasma-treated films in comparison with the untreated control set. These results are verified by (1) extracting dielectric permittivity from Schottky plots as a function of temperature and (2) a statistical interpretation of confidence intervals calculated for hopping fit parameters used in low-temperature nonlinear regression. Outcomes from theoretical analysis of the data are used to provide further insight into how surface chemistry may be tailored to limit high-field leakage current in polyimides and insulating polymers in general.

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Notes

  1. More information on PF analysis including treatment of data and calculated values of εr,PF are provided in the supporting supplemental document, section 1-i.

  2. A more detailed outline of the bootstrap statistical approach can be found in the supporting supplemental document, section 1-ii, a and b. Content found in this manuscript is focused on statistical interpretation only.

  3. Annotated RStudio script used for fitting and bootstrap analysis is found in section 2-i of the supporting supplemental document.

  4. Histograms of parameter estimates from which confidence intervals are derived are presented in the supporting supplemental document, section 3-i-a. Raw data is plotted with superimposed nonlinear fits in section 3-i-b.

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Acknowledgements

The authors of this publication would like to acknowledge the support of the National Science Foundation as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP-1361571 and IIP-1361503. We also would like to acknowledge Adam Walder for his expertise in RStudio script writing and input on statistical analysis of parameter estimates from nonlinear regression. Adam is a Ph.D. student in the department of statistics as part of the Eberly College of Science at Penn State.

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Vecchio, M.A., Meddeb, A.B., Ounaies, Z. et al. Conduction through plasma-treated polyimide: analysis of high-field conduction by hopping and Schottky theory. J Mater Sci 54, 10548–10559 (2019). https://doi.org/10.1007/s10853-019-03574-w

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