Abstract
The lifecycles of vehicular resistor lead in random vibration environment were analyzed in this technical note and the finite element model of a vehicular printed circuit board (PCB) was established. It is with two short edges of PCB fixed for boundary condition to simulate the actual working conditions of the vehicle driving on the road, the constrained modal analysis was simulated and experimental verification were carried out. Both the PCB and the vehicular resistor which soldered on PCB were excited vertically according to Standard GJB150. Based on simulated vibration excitation environment, the power spectral density (PSD) stress value of the resistor lead was calculated. The lifecycles of the resistor lead were calculated theoretically and were verified by following failure-oriented accelerated testing (FOAT). Finally, in order to extend the lifecycles of resistor lead, an improved solution for PCB is put forward.
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The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.
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Funding
This work was supported by the Project of Scientific Research Foundation of Chongqing Technology and Business University [Grant No.2353002].
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Linsen, H. Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration. J Electron Test 40, 101–106 (2024). https://doi.org/10.1007/s10836-024-06099-6
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DOI: https://doi.org/10.1007/s10836-024-06099-6