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The Length of Single-Fault Detection Tests with Respect to Substitution of Inverters for Combinational Elements in Some Bases

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We show that for an arbitrary Boolean function realized by a combinational circuit with elements from a basis whose extension contains the function xy (x\( \overline{y} \)), there exists a circuit that allows a single-fault detection test with at most three (resp. four) tuples.

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Authors and Affiliations

  1. Faculty of Computational Mathematics and Cybernetics, Lomonosov Moscow State University, Moscow, Russia

    G. Temerbekova & D. S. Romanov

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  1. G. Temerbekova
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  2. D. S. Romanov
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Correspondence to G. Temerbekova.

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Translated from Prikladnaya Matematika i Informatika, No. 67, 2021, pp. 89–100.

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Temerbekova, G., Romanov, D.S. The Length of Single-Fault Detection Tests with Respect to Substitution of Inverters for Combinational Elements in Some Bases. Comput Math Model 32, 356–363 (2021). https://doi.org/10.1007/s10598-021-09540-z

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