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A modified sampling scheme for lot sentencing based on the third-generation capability index

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Abstract

The multiple sampling plan (MSP) is an extended model and has been shown to be more efficient with some cost savings associated with its usage than the single and double sampling plans. However, the variables MSP’s operating characteristic (OC) function is complex and difficult to obtain because the judgment at the current sampling should take the preceding sample information into consideration. Therefore, this study proposes the development of a modified MSP for variables inspection by considering independence between stages and integrating with the third-generation capability index. A mathematical model with two constraints is established for obtaining triple plan parameters, which satisfy the specified risk-and-quality conditions and minimize the average sample number (ASN). Additionally, we employed two generally-used performance indicators, ASN and OC curve, to evaluate the performance of the proposed model. The results show that the proposed model provides higher efficiency than the existing plan under the same settings and offers desired protection to both stakeholders. We applied the proposed model to the monocrystalline silicon wafers industry coupled with a designed graphical user interface to validate its practicability.

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Acknowledgements

The extended abstract of this paper was presented at the 2022 Asia Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM 2022).

Funding

This research is partially supported by National Science and Technology Council, Taiwan under Grant No. MOST 110-2221-E-007-112-MY3 and also supported by LPDP Indonesia.

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Authors and Affiliations

  1. Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, Taiwan

    Chien-Wei Wu & Armin Darmawan

  2. Department of Industrial Engineering, Hasanuddin University, Makassar, Indonesia

    Armin Darmawan

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  1. Chien-Wei Wu
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  2. Armin Darmawan
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Correspondence to Chien-Wei Wu.

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Wu, CW., Darmawan, A. A modified sampling scheme for lot sentencing based on the third-generation capability index. Ann Oper Res (2023). https://doi.org/10.1007/s10479-023-05328-z

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