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A built-in self-test for analog reconfigurable filters implemented in a mixed-signal configurable processor

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Abstract

This work introduced a new BIST scheme under a functional test approach. It solves the problem of determining in-field the specifications of lowpass filters embedded in PSoC1 devices with zero hardware overhead. The user can implement the BIST we propose here because it just requires the information and resources freely offered by the manufacturer, the nominal specifications of the filter, and its location within the resources array of the chip. It consists of a software routine that reconfigures the resources available in the device to synthesize all the circuitry needed for the test: stimuli generation, filter response measurement and analysis, data processing, and a communication interface to output the test results. The proposal is based on the transient response analysis method (TRAM), a test strategy for analog filters used to determine the functional parameters of the circuits under test. The BIST performance was evaluated by comparing it against frequency response and TRAM measurements. The laboratory results showed low errors and good repeatability, validating the proposal.

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Data availability

The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.

Code availability

The code generated during the current study is available from the corresponding author on reasonable request.

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Funding

This work was supported by Universidad Tecnológica Nacional and Universidad Nacional de Córdoba.

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Authors and Affiliations

  1. Mechatronics Quality Research Group, Universidad Tecnológica Nacional – Facultad Regional Villa Maria, Av. Universidad 450, Villa María, Argentina

    Emanuel Dri, Gabriela Peretti & Eduardo Romero

  2. Electronics and Instrumental Development Group, Universidad Nacional de Cordoba – Facultad de Matemática Astronomia y Fisica, Av Medina Allende, Ciudad Universitaria, Córdoba, Argentina

    Gabriela Peretti & Eduardo Romero

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  1. Emanuel Dri
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  2. Gabriela Peretti
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  3. Eduardo Romero
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Correspondence to Gabriela Peretti.

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Dri, E., Peretti, G. & Romero, E. A built-in self-test for analog reconfigurable filters implemented in a mixed-signal configurable processor. Analog Integr Circ Sig Process 112, 355–365 (2022). https://doi.org/10.1007/s10470-022-02055-6

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  • DOI: https://doi.org/10.1007/s10470-022-02055-6

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