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Analysis of harmonic contents of switching waveforms emitted by the ultra high speed digital CMOS integrated circuits for use in future micro/nano systems applications

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Abstract

In this paper we outline the influence of transistor model quality and input signal on the estimates of higher order harmonic contents of switching waveforms emitted by the high performance and low power digital integrated circuits. Accurate estimates of higher order harmonic contents are essential in the design and development of highly integrated wireless communication systems. Harmonic contents are used to design tapered buffer chains, but the design quality is influenced by the device model discontinuities. We used Cadence Spectre and Matlab to analyze the spectrum of different flip flop and latch structures. They showed steep spectrum roll-off after the knee frequency. As a concrete example, various kinds of latches and flip-flops, which have the fastest switching capability, are evaluated by using BIM3v3 and BSIM4 transistor models.

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Notes

  1. Spectre is a spice simulator and it’s a proprietary product of Cadence Design Systems. Cadence Virtuoso ADE GXL is a proprietary product of Cadence Design Systems.

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Acknowledgements

Authors would like to thank Dr. Ying-Khai TEH, Assistant Professor at Department of Electrical and Computer Engineering, San Diego State University, USA for his useful comments and help in language aspects of the document. First author would also like to thank Prof. Lars Svensson, Dept. of Computer Engineering, Chalmers University of Technology, Sweden for his ideas on simulation and analysis procedure. Special thanks to the Department of Microsystems Engineering, University of Freiburg, Germany for support.

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Correspondence to Muhammad Imran Khan.

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Khan, M.I., Shoukat, R., Mukherjee, K. et al. Analysis of harmonic contents of switching waveforms emitted by the ultra high speed digital CMOS integrated circuits for use in future micro/nano systems applications. Microsyst Technol 24, 1201–1206 (2018). https://doi.org/10.1007/s00542-017-3486-6

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  • DOI: https://doi.org/10.1007/s00542-017-3486-6

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