Abstract
The rise of spintronics has been closely linked with the development of instrumentation in nano-characterization over the past 20 years. The experimental side of spintronic research today has moved to a point where the paramount urgency is to use materials of the highest perfection and homogeneity as well as analysis tools with atomic sensitivity. Such criteria require usually exclusive techniques, dedicated equipment, and extreme physical conditions, such as ultrahigh vacuum, low temperatures, high fields, etc. This chapter presents some of the most advanced experimental tools, i.e., synchrotron-based magnetic dichroism techniques, which have facilitated the studies of many cutting-edge subjects of spintronics, such as the heterojunction interfacial magnetism, magnetic proximity effect, magnetism in diluted magnetic semiconductors (DMSs), doped topological insulators, half-metallic alloys, magnetic domain structures, and spin transfer torque (STT) effect.
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Abbreviations
- BCC:
-
Body-centered cubic
- BSE:
-
Back-scattered electrons
- CCD:
-
Charge-coupled device
- CIP:
-
Current in plane
- CPP:
-
Current perpendicular to plane
- DMS:
-
Diluted magnetic semiconductor
- DOS:
-
Density of state
- DRAM:
-
Dynamic random-access memory
- EDX:
-
Energy dispersive X-ray
- EM:
-
Electron microscope
- FET:
-
Field-effect transistor
- FM:
-
Ferro- or ferrimagnetic material
- GMR:
-
Giant magnetoresistance
- HCP:
-
Hexagonal close packing
- HM:
-
Half metal
- I:
-
Insulator
- IT:
-
Information technology
- LCP:
-
Left circularly polarized
- LED:
-
Light emission diode
- ML:
-
Monolayer
- MOKE:
-
Magneto-optical Kerr effect
- MRAM:
-
Magnetoresistive random-access memory
- NM:
-
Nonmagnetic
- RCP:
-
Right circularly polarized
- RE:
-
Rare earth
- RT:
-
Room temperature
- SC:
-
Semiconductor or Spin Correction factor
- SRAM:
-
Static random-access memory
- SV:
-
Spin valve
- TEY:
-
Total electron yield
- TFY:
-
Total florescence yield
- TRS:
-
Time reversal symmetry
- UHV:
-
Ultrahigh vacuum
- XAS:
-
X-ray absorption spectroscopy
- XMCD:
-
X-ray magnetic circular dichroism
- XPEEM:
-
X-ray photoemission electron microscopy
- XPS:
-
X-ray photoelectron spectroscopy
- XRD:
-
X-ray diffraction
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Liu, W., Xu, Y., Hassan, S., Weaver, J., van der Laan, G. (2015). Magnetic Dichroism Studies of Spintronic Structures. In: Xu, Y., Awschalom, D., Nitta, J. (eds) Handbook of Spintronics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-7604-3_29-1
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