Abstract
Scanning tunneling microscopy (STM) is one of the basic techniques for the analysis of surface reconstructions, overlayer growth mechanisms, surface dynamics, and chemistry at the atomic scale. STM is used in physics, chemistry, and biology for high resolution studies of organic and inorganic nanoobjects. This chapter is devoted to STM imaging at the level of individual electron orbitals which can lead to improvement of the spatial resolution in STM experiments down to the subatomic scale and development of chemical-selective imaging of multi-component surfaces.
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Acknowledgments
This work was supported by the Russian Academy of Sciences, Russian Foundation for Basic Research (grants № 11-02-01256, 14-02-01234, 11-02-01253, 14-02-00949, 13-02-00781) and Marie Curie International Incoming Fellowship project within the 7th European Community Framework Programme. The author is very grateful to S. N. Molotkov, S. I. Bozhko, S. S. Nazin, V. N. Semenov, A. M. Ionov, V. Yu. Aristov, M. G. Lazarev, N. N. Orlova, A. N. Myagkov, K. N. Eltsov, A. N. Klimov, V. M. Shevlyuga, I. V. Shvets, S. Murphy, S. A. Krasnikov, O. Lübben, B. E. Murphy, K. Radican, A. L. Vazquez de Parga, and F. J. Giessibl for their help and fruitful discussions.
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Chaika, A.N. (2015). High Resolution STM Imaging. In: Kumar, C.S.S.R. (eds) Surface Science Tools for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44551-8_15
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