Abstract
Paper presents some of the research problems encountered during the development of the test stand for research of temperature characteristics of the ultra-precise reference resistors. Such problems includes phenomena which occur immediately after power supply of the test stand. Among identified phenomena are: influence of the data acquisition card, influence of the self-heating of tested and reference resistors, influence of the other electrical elements heating and self-heating. These effects causing significant changes of an indication during initial measurements phase. The paper not only identifies the sources of the errors, but also provides methods of their elimination or compensation, which have been used during the development of the test stand. Thanks to the presented solutions very high accuracy of the measurements was achieved and several measurement methods were proposed.
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Juś, A., Nowak, P., Szewczyk, R., Radzikowska-Juś, W. (2017). Analysis of the Phenomena Occurring During Initial Phase of Resistors Thermal Characteristics Measurement. In: Szewczyk, R., Kaliczyńska, M. (eds) Recent Advances in Systems, Control and Information Technology. SCIT 2016. Advances in Intelligent Systems and Computing, vol 543. Springer, Cham. https://doi.org/10.1007/978-3-319-48923-0_50
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DOI: https://doi.org/10.1007/978-3-319-48923-0_50
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