Abstract
Paper presents new way of identification of temperature parameters of precise resistors. Presented method allows removing heating system and temperature measurement system from the test stand, and is suitable for resistors with extremely low TCR. This approach is based on observation of resistance variation caused by the flow of constant current of known value. Presented method has high measurement accuracy. It is also suitable for process automation, and allows for the simplification of the test stand and shortening of the time required to perform the resistor TCR measurement.
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Juś, A., Nowak, P., Szewczyk, R. (2015). Automatic System for Identification of Temperature Parameters of Resistors Based on Self-heating Phenomena. In: Szewczyk, R., Zieliński, C., Kaliczyńska, M. (eds) Progress in Automation, Robotics and Measuring Techniques. Advances in Intelligent Systems and Computing, vol 352. Springer, Cham. https://doi.org/10.1007/978-3-319-15835-8_11
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DOI: https://doi.org/10.1007/978-3-319-15835-8_11
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-15834-1
Online ISBN: 978-3-319-15835-8
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