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A Brief History of Controlled Atmosphere Transmission Electron Microscopy

  • Chapter
Controlled Atmosphere Transmission Electron Microscopy

Abstract

In this chapter, the development of controlled atmosphere conditions to study gas-solid reactions inside the transmission electron microscope (TEM) will be presented. The two successful approaches to achieve this, namely the use of electron transparent windows and the incorporation of small-bore apertures inside the TEM combined with differential pumping, will be discussed. Finally, we will also describe the state-of-the-art instrumentation available today to study the behavior of nanomaterials in reactive gas environments, which have been largely brought about by the development of aberration correctors, monochromators, specialized TEM holders, as well as faster and more sensitive spectrometers. Examples that highlight the diverse applications in this field will be provided.

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Notes

  1. 1.

    We have, throughout this article, used pressures converted to SI units as well as those quoted in the original publications (in parentheses). The conversions are 1 Torr ≡ 1 mm Hg ≡ 1.33 mbar ≡ 133.3 Pa.

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Acknowledgements

A.L.K. is grateful for the support from the Stanford Nano Shared Facilities. S.C.L. and R.S. acknowledge funding support from the Center of Nanostructuring for Efficient Energy Conversion (CNEEC) at Stanford University, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under award no. DE-SC0001060. R.S. also acknowledges funding from the National Cancer Institute grant CCNE-T U54CA151459-02.

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    Ai Leen Koh

  2. Department of Materials Science and Engineering, Stanford University, Stanford, CA, 94305, USA

    Sang Chul Lee & Robert Sinclair

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    Thomas Willum Hansen

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    Jakob Birkedal Wagner

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Koh, A.L., Lee, S.C., Sinclair, R. (2016). A Brief History of Controlled Atmosphere Transmission Electron Microscopy. In: Hansen, T., Wagner, J. (eds) Controlled Atmosphere Transmission Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-319-22988-1_1

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