Abstract
The scaling of CMOS technology to the nanometer regime inevitability increases reliability concerns, profoundly impacting all aspects of circuit performance and posing a fundamental challenge to future IC design. These reliability concerns arise from many different sources, and become more severe with continuous scaling.
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© 2015 Springer Science+Business Media New York
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Reis, R., Cao, Y., Wirth, G. (2015). Introduction. In: Reis, R., Cao, Y., Wirth, G. (eds) Circuit Design for Reliability. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-4078-9_1
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DOI: https://doi.org/10.1007/978-1-4614-4078-9_1
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