Circuit Design for Reliability

  • Ricardo Reis
  • Yu Cao
  • Gilson Wirth

Table of contents

  1. Front Matter
    Pages i-vi
  2. Ricardo Reis, Yu Cao, Gilson Wirth
    Pages 1-4
  3. B. Kaczer, T. Grasser, J. Franco, M. Toledano-Luque, J. Roussel, M. Cho et al.
    Pages 5-19
  4. Dragica Vasileska, Nabil Ashraf
    Pages 47-67
  5. Takashi Sato, Hiromitsu Awano
    Pages 69-92
  6. Ketul B. Sutaria, Jyothi B. Velamala, Athul Ramkumar, Yu Cao
    Pages 93-119
  7. Veit B. Kleeberger, Christian Weis, Ulf Schlichtmann, Norbert Wehn
    Pages 121-143
  8. Di-an Li, Malgorzata Marek-Sadowska, Sani R. Nassif
    Pages 145-173
  9. Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino
    Pages 175-205
  10. Fernanda Kastensmidt, Ricardo Reis
    Pages 207-221
  11. Sumeet Kumar Gupta, Kaushik Roy
    Pages 223-253
  12. Matthew R. Guthaus, Gustavo Wilke
    Pages 255-272

About this book

Introduction

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

  • Provides comprehensive review on various reliability mechanisms at sub-45nm nodes;
  • Describes practical modeling and characterization techniques for reliability;
  • Includes thorough presentation of robust design techniques for major VLSI design units;
  • Promotes physical understanding with first-principle simulations.

Keywords

Embedded Systems Integrated Circuit Design Integrated Circuit Variability Reliable Integrated Circuits Robust Integrated Circuits

Editors and affiliations

  • Ricardo Reis
    • 1
  • Yu Cao
    • 2
  • Gilson Wirth
    • 3
  1. 1.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  2. 2.School of ECEEArizona State UniversityTempeUSA
  3. 3.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-4078-9
  • Copyright Information Springer Science+Business Media New York 2015
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-4077-2
  • Online ISBN 978-1-4614-4078-9
  • About this book