Definition
Transmission electron microscopy (TEM) is an indispensable technique that uses an electron beam to examine the microstructure of materials, which are thin enough (∼100 nm or thinner) to be transparent to electron beams.
Scientific Fundamentals
Inside a transmission electron microscope, electrons emitted from a filament form either a parallel or convergent beam. The electron beam can be strongly scattered by atomic planes in specimens. Diffraction beams scattered by properly oriented atomic planes (following Bragg’s law) form a diffraction pattern on the back focal plane of the objective lens. The diffraction pattern then becomes the object of the intermediate lens and is projected onto the viewing screen. If the image plane of the objective lens is used as the object of the intermediate lens, then an...
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Zhang, X., Alpas, A. (2013). Characterization of Microstructures by Transmission Electron Microscopy. In: Wang, Q.J., Chung, YW. (eds) Encyclopedia of Tribology. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-92897-5_1215
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DOI: https://doi.org/10.1007/978-0-387-92897-5_1215
Publisher Name: Springer, Boston, MA
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Online ISBN: 978-0-387-92897-5
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