This book addresses the important physical phenomenon of Surface Plasmon Resonance or Surface Plasmon Polaritons in thin metal films, a phenomenon which is exploited in the design of a large variety of physico-chemical optical sensors. In this treatment, crucial materials aspects for design and optimization of SPR sensors are investigated and outlined in detail. The text covers the selection of nanometer thin metal films, ranging from free-electron to the platinum type conductors, along with their combination with a large variety of dielectric substrate materials, and associated individual layer and opto-geometric arrangements. Furthermore, as-yet hardly explored SPR features of selected metal–metal and metal–dielectric super lattices are included in this report. An in-depth multilayer Fresnel evaluation provides the mathematical tool for this optical analysis, which otherwise relies solely on experimentally determined electro-optical materials parameters.
Reviews
“The book begins with an introduction to surface plasmons and surface plasmon resonance sensors, followed by a sensor design guide and descriptions of surface plasmon response models. … Researchers developing surface plasmon methods and sensors would benefit from this book, as would those investigating alternative applications for surface plasmon technology.” (John J. Shea, IEEE Electrical Insulation Magazine, Vol. 32 (1), January-February, 2016)
Authors and Affiliations
Department of Electrical Engineering, Federal University of Campina Grande UFCG/DEE, Campina Grande, Brazil
Leiva Casemiro Oliveira,
Helmut Franz Neff
Department of Electrical Engineering, Federal University of Campina Grande UFCG/DEE, Campina Grande, Brazil
Antonio Marcus Nogueira Lima
Danish National Metrology Institute, Kgs. Lyngby, Denmark
Carsten Thirstrup
About the authors
MSc Leiva Oliveira Dr. Antonio Marcus Nogueira Lima Dr. Carsten Thirstrup Dr. Helmut Franz Neff.
Bibliographic Information
Book Title: Surface Plasmon Resonance Sensors
Book Subtitle: A Materials Guide to Design and Optimization
Authors: Leiva Casemiro Oliveira, Antonio Marcus Nogueira Lima, Carsten Thirstrup, Helmut Franz Neff
