Localised Electrochemical Desorption of Gold Alkanethiolate Monolayers by Means of Scanning Electrochemical Microscopy (SECM) Thomas WilhelmGunther Wittstock Pages: 1 - 9
Quantitative Acoustic Microscopy for Determination of Properties of Hard Coatings Ellen Matthaei-SchulzTony FlahertyLaurent Robert Pages: 11 - 15
Oxidation, Diffusion and Segregation in CuNi(Mn) Films Studied by AES Stefan BaunackWinfried Brückner Pages: 17 - 22
In-Depth Analysis of the Early Stage Corrosion of Technical Glass Fibers Günther H. FrischatStefan Priller Pages: 23 - 27
XPS and SIMS Examination of Alumina Fibres Affected with Mg and MgLi Melt Stanislav KúdelaSteffen OswaldKlaus Wetzig Pages: 29 - 34
Infrared Spectroscopic Analysis of Plasma-Treated Si(100)-Surfaces Manfred ReicheMarco WiegandUlrich Gösele Pages: 35 - 43
Carbon Species and Precise Elemental Analysis of Precursors for Superconducting (Bi,Pb)2Sr2Ca2Cu3Ox Tapes Wolfgang GrunerRolf KucharkowskiTorsten Fahr Pages: 45 - 50
Basics, Possibilities and Limitations of the Microscopic X-Ray Fluorescence Analysis Robert HaberkornHorst P. Beck Pages: 51 - 58
Examination of the Excitation Performance of Different Capillary Optics Michael HaschkeUllrich Theis Pages: 59 - 63
Potential of Total Reflection and Grazing Incidence XRF for Contamination and Process Control in Semiconductor Fabrication Cornelia WeissJoachim KnothHans-Jürgen Ullrich Pages: 65 - 68
INA-X: An Advanced Instrument for Electron-Gas SNMS Hans OechsnerWolfgang BockMathias Müller Pages: 69 - 73
Quantitative Sputter Depth Profiling of Silicon- and Aluminium Oxynitride Films Sabine DreerPeter WilhartitzGernot Friedbacher Pages: 75 - 87
Investigations on the Thermal Cycling Stability of SiFeCr Coated NbtZr Martin GritschKurt PiplitsHerbert Hutter Pages: 89 - 93
Artificial Neural Network and Fuzzy Clustering – New Tools for Evaluation of Depth Profile Data? Henning BubertHeinrich Hillig Pages: 95 - 103
Solid State Analysis with the New Leipzig High-Energy Ion Nanoprobe Jürgen VogtRolf-Horst FlagmeyerTilman Butz Pages: 105 - 111
Surface Chemistry of Planarized SiLK-Films Studied by XPS Jan HeegUlf SchubertFrank Küchenmeister Pages: 113 - 117
Atomic Force Microscopy Studies of SnO2 Thin Film Microstruc tures Deposited by Atomic Layer Epitaxy Mikko UtriainenHanna LattuGernot Friedbacher Pages: 119 - 123
EFTEM and EELS Analysis of a Pt/NiO Interface Werner GroggerFerdinand HoferPeter Warbichler Pages: 125 - 129
Nanoscale Co/Cu Multilayers Investigated by Analytical TEM and AES Jürgen ThomasAndreas JohnKlaus Wetzig Pages: 131 - 135
Chromate-Free Zinc Conversion Coatings Characterised by Grazing Incidence X-Ray Diffractometry Mario SahreRicardo M. SoutoWolfgang Kautek Pages: 137 - 142
Separation and Analysis of Theran Volcanic Glass by INAA, XRF and EPMA Petra SchmidClaudia PeltzMax Bichler Pages: 143 - 149
Identification and Classification of Iridescent Glass Artifacts with XRF and SEM/EDX Dubravka JembrihManfred SchreinerChristian Clausen Pages: 151 - 157
Multianalytical Study of Patina Formed on Archaeological Metal Objects from Bliesbruck-Reinheim Michael WadsakIna ConstantinidesMichel Wuttmann Pages: 159 - 164
Energy Dispersive X-Ray Fluorescence Analysis and X-Ray Microanalysis of Medieval Silver Coins Robert LinkeManfred Schreiner Pages: 165 - 170
Investigation of Chemically Treated Basalt and Glass Fibres Marion FriedrichAnne SchulzeDietrich R. T. Zahn Pages: 171 - 174
Characterization of Surface Modified Silica Nanoparticles by 29Si Solid State NMR Spectroscopy Jelena MijatovicWolfgang H. BinderHeinrich Gruber Pages: 175 - 181
SIMS Profiling and TEM of CVD Films on Multi-Filament Samples Dagmar DietrichPeter WillichGünter Marx Pages: 183 - 186
Determination of the Molar Decadic Absorptivities of the Stretching Vibrations of the Hydride and Phenyl Groups on Aerosil® 300 Katrin HegerGünter Marx Pages: 187 - 189
Preparation of Cr2O3-Al2O3 Solid Solutions by Reactive Magnetron Sputtering Mirjam WitthautRainer CremerDieter Neuschütz Pages: 191 - 196
Preparation, Characterization and Crystal Structure of [Be(NCSe)2(HCON(CH3)2)2] Werner HanayHeinz BöhlandHans-Georg Schmidt Pages: 197 - 201
FT-Raman-Spectroscopic Study on the Luminescence of Synthetic and Mineral Apatites Petra MeuerAxinja WolfWolfgang Kiefer Pages: 203 - 207
Analytics of CVD Processes in the Deposition of SiC by Methyltrichlorosilane Jens HeinrichSteffen HemeltjenGünter Marx Pages: 209 - 214
Oxidation Behaviour of PACVD-(Ti,Al)N Wear Resistance Layers Siegfried MenzelThomas GöbelKlaus Wetzig Pages: 215 - 221
EPMA and GDOES in Functional-Gradient Hardmetal Systems Jose GarciaSusanne TrampertKlaus Dreyer Pages: 223 - 231
WDX Analysis of Rapidly Quenched Nd-Fe-B Alloys with Ti + C Additives Ingrid BächerRegina Hermann Pages: 233 - 237
Investigation of Co/Cu/NiFe-Multilayers by X-Ray Reflectometry and Diffraction Michael HeckerDetlev TietjenClaus M. Schneider Pages: 239 - 241
Phase Equilibria in the Ternary System Fe-Gd-Mo at 600 °C Matvei ZinkevitchNorbert MatternKlaus Wetzig Pages: 243 - 251
Application of SIMS in Re-Technology Studies: Characterization of Trace-Element Distributions and Quantitative of Carbon-Determination Sven MusserHeiko WildnerHerbert Hutter Pages: 253 - 259
SIMS Characterisation of Aluminum-Alloyed Hot Isostatic Pressed Steel Christoph PollakBrigitte KrisztHerbert Hutter Pages: 261 - 266
Characterization of Two-Component Metal Coatings (Al/Sn) with SIMS Martin RosnerChristoph Eisenmenger-SittnerHerbert Hutter Pages: 267 - 271
Fusion of 2-D SIMS Images Using the Wavelet Transform Thomas C. StubbingsStavri G. NikolovHerbert Hutter Pages: 273 - 278
Analytical X-Ray Microscopy on Psaronius sp. – A Contribution to Permineralization Process Studies Dagmar DietrichGeorg FroschGünter Marx Pages: 279 - 283
Chemical Composition and Microstructure of Plasma-Nitrided Aluminium Harry PodlesakUta FaustHeinz-Rolf Stock Pages: 285 - 288
Influence of Pickling High Alloyed CrNi-Steels and Nickel Base Alloys with Citric Acid on the Composition of their Tarnish Oxides Gunther PajonkHenning Bubert Pages: 289 - 293
Synthesis and Microstructure of Anodic Spark Deposited SrZrO3 Joachim P. SchreckenbachDiethard ButteGünter Marx Pages: 295 - 298
Deposition and Characterization of Metastable Cu3N Layers for Applications in Optical Data Storage Rainer CremerMirjam WitthautHeinrich Kurz Pages: 299 - 302
XPS Depth Profile Analysis of a Thin Non-Conducting Titanate Superlattice Steffen OswaldWolfgang HäßlerFrançois Weiss Pages: 303 - 306
Trace Analysis by Heavy Ion Induced X-Ray Emission Klaus H. EckerHans-Peter WeiseKarl L. Merkle Pages: 313 - 317
Determination of the Stoichiometric Composition of High-Temperature Superconductors by ICP-OES for Production Control Dirk GeilenbergMichael GerardsJosé A. C. Broekaert Pages: 319 - 323