Slater Pauling magnetization curve in transition metal phosphides Y. S. TyanL. E. Toth OriginalPaper Pages: 1 - 7
Application of negative electron affinity materials to imaging devices F. R. HughesE. D. SavoyeD. L. Thoman OriginalPaper Pages: 9 - 23
A stabilized tantalum diffusion barrier for the gold metallization system Aristotelis ChristouHoward M. Day OriginalPaper Pages: 25 - 35
Vapor-grown In1−xGaxP electroluminescent junctions on GaAs C. J. NueseA. G. SigaiT. Zamerowski OriginalPaper Pages: 51 - 78
Chalcogenide glasses as passive thin film structures for integrated optics R. M. Klein OriginalPaper Pages: 79 - 99
Electromigration-induced failures in thin-film Al-Cu conductors B. N. AgarwalaL. BerenbaumP. Peressini OriginalPaper Pages: 137 - 153
Photoresponse of high resistivity cadmium telluride between room temperature and 400°C R. FarrellG. EntineF. V. Wald OriginalPaper Pages: 155 - 170
Annealing behavior of electroplated permalloy thin films. II A. GanguleeR. L. Anderson OriginalPaper Pages: 171 - 192
Some properties of Cu2SnSe3, Cu2GeSe3 and other A 2 I BIVC 3 VI compounds Walter Scott OriginalPaper Pages: 209 - 223
A laser scan technique for electronic materials surface evaluation D. R. OswaldD. F. Munro OriginalPaper Pages: 225 - 242
