Electrical characterization of ultrathin oxides of silicon grown by N2O plasma assisted oxidation V. K. BhatK. N. BhatA. Subrahmanyam Regular Issue Paper Pages: 399 - 404
Interfacial reactions between liquid indium and Au-deposited substrates Y. M. LiuT. H. Chuang Regular Issue Paper Pages: 405 - 410
Surface etching of 6H-SiC (0001) and surface morphology of the subsequently grown GaN via MOCVD Z. Y. XieC. H. WeiJ. H. Edgar Regular Issue Paper Pages: 411 - 417
Effect of oxygen on the properties of encapsulated polycrystalline CdSe films M. J. LeeR. M. LangfordR. J. Chater Regular Issue Paper Pages: 418 - 425
Oxygen-related deep levels in Al0.5In0.5P grown by MOVPE J. G. CederbergB. BiegT. F. Kuech Regular Issue Paper Pages: 426 - 429
Reconstruction of excitonic spectrum during annealing of ZnSe:N grown by metalorganic vapor phase epitaxy A. L. GurskiiH. HamadehK. Heime Regular Issue Paper Pages: 430 - 435
Characterizing the layer properties of AlGaAs/GaAs heteroface solar cell structures by specular spectral reflectance Carlos Algora Regular Issue Paper Pages: 436 - 442
Die bonding with Au/In isothermal solidification technique T. B. WangZ. Z. ShenJ. Freytag Regular Issue Paper Pages: 443 - 447
Changes in electrical characteristics associated with degradation of InGaN blue light-emitting diodes Z. -Q. FangD. C. ReynoldsD. C. Look Regular Issue Paper Pages: 448 - 451
MOCVD growth of GaBN on 6H-SiC (0001) substrates C. H. WeiZ. Y. XieD. N. Braski Regular Issue Paper Pages: 452 - 456
Quantitative analysis of small amounts of cubic GaN phase in GaN films grown on sapphire D. ZhiU. TischJ. Salzman Regular Issue Paper Pages: 457 - 462
XPS and ellipsometric characterization of zinc-BTA complex V. SirtoriF. ZambonL. Lombardi Regular Issue Paper Pages: 463 - 467
MOVPE growth of (Al,Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy K. HaberlandA. BhattacharyaW. Richter OriginalPaper Pages: 468 - 472