1. Proximal probe characterization of nanoscale charge transport properties in Co/SiO₂ multilayer structures

   • D. M. Schaadt
   • E. T. Yu
   • A. E. Berkowitz

   Regular Issue Paper Pages: 1299 - 1303

2. Chemical vapor deposition of B₁₂As₂ thin films on 6H-SiC

   • R. H. Wang
   • D. Zubia
   • S. D. Hersee

   Regular Issue Paper Pages: 1304 - 1306

3. The effect of small additions of copper on the aging kinetics of the intermetallic layer and intermetallic particles of eutectic tin-silver solder joints

   • J. Sigelko
   • S. Choi
   • J. P. Lucas

   Regular Issue Paper Pages: 1307 - 1311

4. Mechanistic study of borosilicate glass growth by low-pressure chemical vapor deposition from tetraethylorthosilicate and trimethylborate

   • D. M. Hansen
   • D. Charters
   • T. F. Kuech

   Regular Issue Paper Pages: 1312 - 1318

5. Effect of copper and chlorine on the properties of SiO₂ encapsulated polycrystalline CdSe films

   • R. M. Langford
   • M. J. Lee
   • T. Tate

   Regular Issue Paper Pages: 1319 - 1327

6. Interfacial reactions between In 10Ag solders and Ag substrates

   • Y. M. Liu
   • T. H. Chuang

   Regular Issue Paper Pages: 1328 - 1332

7. Electrochemical capacitance voltage profiling of the narrow band gap semiconductor InAs

   • V. Gopal
   • E. -H. Chen
   • J. M. Woodall

   Regular Issue Paper Pages: 1333 - 1339

8. Al, B, and Ga ion-implantation doping of SiC

   • Evan M. Handy
   • Mulpuri V. Rao
   • T. Venkatesan

   Regular Issue Paper Pages: 1340 - 1345

9. Modulation spectroscopy study of a strained layer GaAs/GaAsP multiple quantum well structure

   • L. Malikova
   • Fred H. Pollak
   • Alexander Korotcov

   Regular Issue Paper Pages: 1346 - 1350

10. Charge accumulation of quantum dots at room temperature

    • C. E. Stutz
    • Qianghua Xie
    • J. L. Brown

    Letter Pages: L29 - L31