1. Thermal Conductivity of Cu₂ZnGe_{1 –x}Sn_xSe₄ Alloys

   • I. V. Bodnar

   NONELECTRONIC PROPERTIES OF SEMICONDUCTORS (ATOMIC STRUCTURE, DIFFUSION) 03 March 2020 Pages: 159 - 162

   

2. Negative Differential Conductivity of Lanthanum-Oxide-Based Structures

   • A. Igityan
   • N. Aghamalyan
   • Y. Kafadaryan

   ELECTRONIC PROPERTIES OF SEMICONDUCTORS 03 March 2020 Pages: 163 - 168

   

3. Fabrication and Analysis of the Current Transport Mechanism of Ni/n-GaN Schottky Barrier Diodes through Different Models

   • S. Kumar
   • M. V. Kumar
   • S. Krishnaveni

   ELECTRONIC PROPERTIES OF SEMICONDUCTORS 03 March 2020 Pages: 169 - 175

   

4. Profiling Mobility Components near the Heterointerfaces of Thin Silicon Films

   • E. G. Zaitseva
   • O. V. Naumova
   • B. I. Fomin

   SURFACES, INTERFACES, AND THIN FILMS 03 March 2020 Pages: 176 - 180

   

5. Ge/Si Core/Shell Quantum Dots in an Alumina Matrix: Influence of the Annealing Temperature on the Optical Properties

   • O. M. Sreseli
   • N. A. Bert
   • A. N. Yablonsky

   SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 03 March 2020 Pages: 181 - 189

   

6. Molecular States of Composite Fermions in Self-Organized InP/GaInP Quantum Dots in Zero Magnetic Field

   • A. M. Mintairov

   SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 03 March 2020 Pages: 190 - 195

   

7. Influence of Radiation Defects Induced by Low-Energy Protons at a Temperature of 83 K on the Characteristics of Silicon Photoelectric Structures

   • N. M. Bogatov
   • L. R. Grigorian
   • L. S. Lunin

   SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 03 March 2020 Pages: 196 - 200

   

8. Structural and Dielectric Study of Thin Amorphous Layers of the Ge–Sb–Te System Prepared by RF Magnetron Sputtering

   • R. A. Castro-Arata
   • V. M. Stozharov
   • A. V. Kolobov

   AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 03 March 2020 Pages: 201 - 204

   

9. Dielectric Spectroscopy and Features of the Mechanism of the Semiconductor–Metal Phase Transition in VO₂ Films

   • A. V. Ilinskiy
   • R. A. Kastro
   • E. B. Shadrin

   MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 03 March 2020 Pages: 205 - 211

   

10. Effect of Temperature on the Morphology of Planar GaAs Nanowires (Simulation)

    • A. A. Spirina
    • N. L. Shwartz

    MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 03 March 2020 Pages: 212 - 216

    

11. Energy-Efficient Gas Sensors Based on Nanocrystalline Indium Oxide

    • E. A. Forsh
    • E. A. Guseva

    MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 03 March 2020 Pages: 217 - 221

    

12. Exactly Solvable Model Problem on a Graphene Nanoribbon with Zigzag Edges

    • S. Yu. Davydov
    • A. V. Zubov

    CARBON SYSTEMS 03 March 2020 Pages: 222 - 227

    

13. Structural and Photoluminescence Properties of Graphite-Like Carbon Nitride

    • A. V. Baglov
    • E. B. Chubenko
    • V. V. Uglov

    CARBON SYSTEMS 03 March 2020 Pages: 228 - 232

    

14. Model of the Negative-Bias Temperature Instability of p-MOS Transistors

    • O. V. Aleksandrov

    PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 233 - 239

    

15. Model of the Effect of the Gate Bias on MOS Structures under Ionizing Radiation

    • O. V. Aleksandrov
    • S. A. Mokrushina

    PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 240 - 245

    

16. Effect of Temperature on the Characteristics of 4H-SiC UV Photodetectors

    • E. V. Kalinina
    • G. N. Violina
    • A. V. Nikolaev

    PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 246 - 252

    

17. Long-Wavelength LEDs in the Atmospheric Transparency Window of 4.6–5.3 μm

    • V. V. Romanov
    • E. V. Ivanov
    • Yu. P. Yakovlev

    PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 253 - 257

    

18. Edge-Termination Technique for High-Voltage Mesa-Structure 4H-SiC Devices: Negative Beveling

    • N. M. Lebedeva
    • N. D. Il’inskaya
    • P. A. Ivanov

    PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 258 - 262

    

19. Comparative Analysis of Injection Microdisk Lasers Based on InGaAsN Quantum Wells and InAs/InGaAs Quantum Dots

    • E. I. Moiseev
    • M. V. Maximov
    • A. E. Zhukov

    PHYSICS OF SEMICONDUCTOR DEVICES 03 March 2020 Pages: 263 - 267

    

20. Investigation of the Influences of Post-Thermal Annealing on Physical Properties of TiO₂ Thin Films Deposited by RF Sputtering

    • H. E. Doghmane
    • T. Touam
    • B. Bordji

    FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES 03 March 2020 Pages: 268 - 273