Electronic Properties of Branched Molecular Structures Review A. A. GorbatsevichM. N. Zhuravlev BASIC RESEARCH 04 January 2021 Pages: 1741 - 1750
Possible Enhancement of the Modulation Rate of Light-Emitting Diodes in Wireless Optical Data Transfer Networks by Means of Metal Nanoparticles with a Dielectric Shell D.V. GuzatovS. V. GaponenkoO.I. Tevel BASIC RESEARCH 04 January 2021 Pages: 1751 - 1756
Forming Low-Resistance p-Type Layers in Ga1 – xAlxN/GaN Heterostructures E. N. Vigdorovich ELECTRONICS MATERIALS 04 January 2021 Pages: 1757 - 1763
Method of Determining the Elastic Characteristics of Graphene and Other 2D Nanoallotropes R. A. BrazheD. A. Dolgov ELECTRONICS MATERIALS 04 January 2021 Pages: 1764 - 1769
Plasmon-Acoustic Transducers Based on Graphene–2D Boron Nitride Structures for the Terahertz-Frequency Range R. A. BrazheD. A. Dolgov ELECTRONICS MATERIALS 04 January 2021 Pages: 1770 - 1774
Influence of the Degree of Crystallinity on the Dispersion of the Optical Parameters of Ge2Sb2Te5 Phase-Change Memory Thin Films M. E. FedyaninaP. I. LazarenkoA. A. Sherchenkov ELECTRONICS MATERIALS 04 January 2021 Pages: 1775 - 1783
On the Lateral Recrystallization of Amorphous Silicon Nanostructures Using Nickel Silicide S. O. BelostotskayaE. V. KuznetsovO. V. Gubanova TECHNOLOGICAL PROCESSES AND ROUTES 04 January 2021 Pages: 1784 - 1790
Investigation of the Electrochemical Stop Etching of Silicon Upon the Fabrication of Cantilevers A. V. NovakV. R. Novak TECHNOLOGICAL PROCESSES AND ROUTES 04 January 2021 Pages: 1791 - 1795
On the Photoresponse Kinetics and Amplitude of Silicon Photoelectric Multipliers M. A. AsayonokA. O. ZenevichE. V. Novikov ELEMENTS OF INTEGRATED ELECTRONICS 04 January 2021 Pages: 1796 - 1799
Influence of the Formation Parameters of Phthalociane:Fullerene Nanocomposite Layer on the Photoelectric Characteristics of ZnPc:C60/C60 Structures M. D. PavlovaA. E. DegterevS. A. Tarasov ELEMENTS OF INTEGRATED ELECTRONICS 04 January 2021 Pages: 1800 - 1804
Correlation of Physical and Information Entropies in Reliability Theory for Nanoscale Elements V. S. KozhevnikovI. V. MatyushkinT. D. Zhukova ELEMENTS OF INTEGRATED ELECTRONICS 04 January 2021 Pages: 1805 - 1810