Induced photopleochroism in semiconductors Review F. P. KesamanlyV. Yu. Rud’Yu. V. Rud’ Review Pages: 483 - 503
Effect of in situ photoexcitation of n-type Si as a result of ion implantation at low doses on the formation of radiation defects M. Yu. BarabanenkovA. V. LeonovN. M. Omel’yanovskaya Atomic Structure and Non-Electronic Properties of Semiconductors Pages: 504 - 507
Effect of the irradiation intensity on the efficiency of the production radiation defects in n-and p-type Si crystals T. A. PagavaZ. V. Basheleishvili Atomic Structure and Non-Electronic Properties of Semiconductors Pages: 508 - 509
Spontaneously forming periodic composition-modulated InGaAsP structures N. A. BertL. S. VavilovaV. A. Shchukin Atomic Structure and Non-Electronic Properties of Semiconductors Pages: 510 - 513
Absorption of infrared radiation by free charge carriers in n-type Cd1−x ZnxTe A. I. BelogorokhovA. G. BelovL. I. Belogorokhova Electronic and Optical Properties of Semiconductors Pages: 514 - 517
Optoelectronic effects in semi-insulating CdTe single crystals and structures based on them G. A. Il’chukN. A. UkrainetsV. Yu. Rud’ Electronic and Optical Properties of Semiconductors Pages: 518 - 522
Photoluminescence of Si3N4 films implanted with Ge+ and Ar+ ions I. E. TyschenkoV. A. VolodinV. Skorupa Electronic and Optical Properties of Semiconductors Pages: 523 - 528
Slow photoconductivity relaxation due to radiation defects in p-type Si S. E. Mal’khanov Electronic and Optical Properties of Semiconductors Pages: 529 - 530
Dependence of the properties of Cd1−x ZnxTe crystals on the type of intrinsic point defect formed by oxygen N. K. MorozovaI. A. KaretnikovV. S. Zimogorskii Electronic and Optical Properties of Semiconductors Pages: 531 - 535
Low-temperature anomalies exhibited by the photoelectromagnetic effect in p-type CdxHg1−x Te S. G. Gasan-zadeM. V. StrikhaG. A. Shepelskii Electronic and Optical Properties of Semiconductors Pages: 536 - 540
The effect of fields due to charge centers at random locations in a semiconductor crystal on the electronic structure of neutral acceptors and on the polarization of luminescence generated by 〈conduction band〉-acceptor transitions E. B. OsipovO. V. VoronovB. V. Borisov Electronic and Optical Properties of Semiconductors Pages: 541 - 543
The effect of intense laser light on the absorption-edge region of the spectrum of a CdCr2Se4 ferromagnetic semiconductor L. L. GolikZ. É. Kun’kova Electronic and Optical Properties of Semiconductors Pages: 544 - 546
Saturated vertical drift velocity of electrons in silicon carbide polytypes V. I. SankinA. A. Lepneva Semiconductor Structures, Interfaces and Surfaces Pages: 547 - 550
Multiple Andreev reflection in hybrid AlGaAs/GaAs structures with superconducting NbN contacts A. A. VerevkinN. G. PtitsinaK. S. Yngvesson Semiconductor Structures, Interfaces and Surfaces Pages: 551 - 554
Nanorelief of an oxidized cleaved surface of a grid of alternating Ga0.7Al0.3As and GaAs heterolayers A. V. AnkudinovV. P. EvtikhievA. N. Titkov Semiconductor Structures, Interfaces and Surfaces Pages: 555 - 558
Spectrum and electron-phonon interaction in a medium with a cylindrical quantum wire N. V. TkachV. P. Zharkoi Low-Dimensional Systems Pages: 559 - 563
Electron and hole spectra in a superlattice of cylindrical quantum wires V. M. GolovachG. G. ZegryaN. V. Tkach Low-Dimensional Systems Pages: 564 - 568
Vibrational spectra of erbium-and copper-modified hydrogenated amorphous carbon V. I. Ivanov-OmskiiA. A. AndreevG. S. Frolova Amorphous, Glassy and Porous Semiconductors Pages: 569 - 573
Current-voltage characteristics of Si:As-based photodetectors with blocked hopping conductivity D. G. EsaevS. P. SinitsaE. V. Chernyavskii The Physics of Semiconductor Devices Pages: 574 - 577
D’yakonov-Shur instability in a ballistic field-effect transistor with a spatially nonuniform channel M. V. CheremisinG. G. Samsonidze The Physics of Semiconductor Devices Pages: 578 - 585
InGaAs/GaAs structures with quantum dots in vertical optical cavities for wavelengths near 1.3 µm N. A. MaleevA. E. ZhukovD. Bimberg The Physics of Semiconductor Devices Pages: 586 - 589
Correlation between the reliability of laser diodes and the crystal perfection of epitaxial layers estimated by high-resolution x-ray diffractometry V. P. EvtikhievE. Yu. Kotel’nikovN. N. Faleev The Physics of Semiconductor Devices Pages: 590 - 593