Non-Contact Subsurface Defects Characterization by Microwave and Millimeter Wave Techniques M. MaaziO. BenzaimT. Lasri OriginalPaper 28 November 2006 Pages: 125 - 154
Low Cost Microwave Sensor for Moisture Content Measurement in Paper Milling Industry Guido Biffi GentiliCristiano RiminesiVasco Tesi OriginalPaper 02 December 2006 Pages: 155 - 173