Automatic ultrasonic defect locating and sizing by a probabilistic approach with high accuracy Zhang Jiaping OriginalPaper Pages: 213 - 223
Some examples of nondestructive flaw detection by shearography F. S. ChauS. L. TohH. M. Shang OriginalPaper Pages: 225 - 234
Nondestructive low-cycle fatigue characterization of multi-layer thin film structures Yoshiki OshidaP. C. Chen OriginalPaper Pages: 235 - 245
An iterative calculation of eddy-current responses due to three-dimensional defects G. L. HowerD. E. Hadlock OriginalPaper Pages: 247 - 255
