Characterization of flaws using the zeroes of the real and imaginary parts of the ultrasonic scattering amplitude Vladimir G. KoganDavid K. HsuJames H. Rose OriginalPaper Pages: 57 - 68
A new acoustic spectroscopy: Resonance spectroscopy by the MIIR Jean RipocheGérard MazeJean-Louis Izbicki OriginalPaper Pages: 69 - 79
Surface electromagnetic fields around surface flaws in metals R. CollinsD. H. MichaelH. G. Pinsent OriginalPaper Pages: 81 - 93
Two-dimensional inverse born approximation in ultrasonic flaw characterization K. C. Tam OriginalPaper Pages: 95 - 106
