Plane-wave x-ray topography and its application to semiconductor problems R. Ko¨hler OriginalPaper Pages: 167 - 174
Study of the lattice strain relaxation in the Ga1-X Al X Sb/GaSb system by x-ray topography and high resolution diffraction C. BocchiF. GerminiA. V. Drigo OriginalPaper Pages: 185 - 190
Reciprocal-space analysis of compositional modulation in short-period superlattices using position-sensitive x-ray detection S. R. LeeJ. Mirecki MillunchickA. G. Norman OriginalPaper Pages: 191 - 197
X-ray diffraction reciprocal space and pole figure characterization of cubic GaN epitaxial layers grown on (0 0 1) GaAs by molecular beam epitaxy Zhixin QinMasakazu KobayashiAkihiko Yoshikawa OriginalPaper Pages: 199 - 202
Characterization of strain relaxation of (0 0 1) oriented SrTiO3 thin films grown on LaAIO3 (1 1 0) by means of reciprocal space mapping using x-ray diffraction C. N. L. EdvardssonJ. BirchU. Helmersson OriginalPaper Pages: 203 - 208
Grazing incidence reciprocal space mapping of partially relaxed SiGe films P. M. Mooney OriginalPaper Pages: 209 - 213
X-ray diffraction from quantum wires and quantum dots Y. ZhuangJ. StanglU. Pietsch OriginalPaper Pages: 215 - 221
Diffuse x-ray reflection from multilayers with rough interfaces V. Holy´ OriginalPaper Pages: 223 - 226