Mismatch Modeling and Simulation—A Comprehensive Approach Ulrich GrünebaumJürgen OehmKlaus Schumacher OriginalPaper Pages: 165 - 171
An Accurate Statistical Yield Model for CMOS Current-Steering D/A Converters Anne van den BoschMichiel SteyaertWilly Sansen OriginalPaper Pages: 173 - 180
Parametric Yield Optimization of MOS IC's Affected by Device Mismatch Massimo ContiPaolo CrippaClaudio Turchetti OriginalPaper Pages: 181 - 199
FASTEST: A Tool for a Complete and Efficient Statistical Evaluation of Analog Circuits. DC Analysis Rafael López-AhumadaRafael Rodríguez-Macías OriginalPaper Pages: 201 - 212
Statistical Analysis and Optimization of a Bandgap Reference for VLSI Applications Jürgen OehmUlrich Grünebaum OriginalPaper Pages: 213 - 220
Statistical Design of a 10 bit Current Division Network Tuna B. TarimMohammed Ismail OriginalPaper Pages: 221 - 229
Novel Lossless Floating Immittance Simulator Employing Only Two FTFNs Uğur ÇamOğuzhan ÇiçekoğluHakan Kuntman OriginalPaper Pages: 233 - 235