1. Guest Editorial

   • Tuna B. Tarim

   Editorial Introduction Pages: 163 - 163

2. Mismatch Modeling and Simulation—A Comprehensive Approach

   • Ulrich Grünebaum
   • Jürgen Oehm
   • Klaus Schumacher

   OriginalPaper Pages: 165 - 171

3. An Accurate Statistical Yield Model for CMOS Current-Steering D/A Converters

   • Anne van den Bosch
   • Michiel Steyaert
   • Willy Sansen

   OriginalPaper Pages: 173 - 180

4. Parametric Yield Optimization of MOS IC's Affected by Device Mismatch

   • Massimo Conti
   • Paolo Crippa
   • Claudio Turchetti

   OriginalPaper Pages: 181 - 199

5. FASTEST: A Tool for a Complete and Efficient Statistical Evaluation of Analog Circuits. DC Analysis

   • Rafael López-Ahumada
   • Rafael Rodríguez-Macías

   OriginalPaper Pages: 201 - 212

6. Statistical Analysis and Optimization of a Bandgap Reference for VLSI Applications

   • Jürgen Oehm
   • Ulrich Grünebaum

   OriginalPaper Pages: 213 - 220

7. Statistical Design of a 10 bit Current Division Network

   • Tuna B. Tarim
   • Mohammed Ismail

   OriginalPaper Pages: 221 - 229

8. Novel Lossless Floating Immittance Simulator Employing Only Two FTFNs

   • Uğur Çam
   • Oğuzhan Çiçekoğlu
   • Hakan Kuntman

   OriginalPaper Pages: 233 - 235