Resonant Slit-type Probe with Rounded Matching Structure for Terahertz Imaging

Abstract

We propose a resonant slit-type probe with a rounded matching structure in the inner corner of the probe slit, for high-resolution terahertz (THz) imaging. The proposed probe can achieve high coupling efficiency and maintain a stable resonant frequency in spite of the increase in slit thickness. The THz signal measured by the proposed probe was 1.7 times more sensitive than that by a right angle structure probe when a 50 μm diameter metal ball was located 100 um away from the slits. The resonant frequency and return loss |S11| measurements of the prototype resonant probe using a vector network analyzer (VNA) were in good agreement with a simulation results. We achieved a spatial resolution of 100 μm with a slit height of 140 μm. Also, to determine the potential of the proposed probe in the THz applications, we measured THz images according to the thickness of covering flour and the distance between the probe and the flour for the foreign objects in the flour. The proposed probe detected a metal wire with a diameter of 70 μm beneath 1.5 mm of flour at a distance between flour and probe of 1 mm. Consequently, we confirmed that the proposed probe could potentially be applied as a new THz probe.