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Unipolar resistance switching characteristics in a thick ZnO/Cu/ZnO multilayer structure

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Abstract

The resistance switching mechanism and the electrical conduction of thick Cu/ZnO/Cu/ZnO/Cu structures were investigated for various ZnO thicknesses (40, 80, 160, and 320 nm) when the thickness of the middle Cu layer was 2 nm. The ZnO films had a microstructure with columnar grains normal to the substrate. The switching voltages (VSET and VRESET) varied with the thickness of the ZnO layer. A symmetric electrode structure exhibited a unipolar resistance switching. The electrical transport of both high-resistance state (HRS) and low-resistance state (LRS) was Ohmic conduction, and the resistance switching mechanism was driven by the formation and the rupture of Cu conducting paths.

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Authors and Affiliations

  1. Faculty of Physics and Engineering Physics, University of Science, Vietnam National University, HoChiMinh City, Vietnam

    Tran Le & Hoang Cao Son Tran

  2. Faculty of Materials Science, University of Science, Vietnam National University, HoChiMinh City, Vietnam

    Hieu Van Le & Tuan Tran

  3. Laboratory of Advanced Materials, University of Science, Vietnam National University, HoChiMinh City, Vietnam

    Cao Vinh Tran

  4. University of Technical Education, HoChiMinh City, Vietnam

    Thanh Tan Vo

  5. Laboratory of Nanotechnology, Vietnam National University, HoChiMinh City, Vietnam

    Mau Chien Dang

  6. School of Materials Science and Engineering, Inha University, Incheon, 402-751, Korea

    Sang Sub Kim

  7. School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 440-746, Korea

    Jaichan Lee

  8. Faculty of Materials Science and Laboratory of Advanced Materials, University of Science, Vietnam National University, HoChiMinh City, Vietnam

    Bach Thang Phan

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  1. Tran Le
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  2. Hoang Cao Son Tran
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  3. Hieu Van Le
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  4. Tuan Tran
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  5. Cao Vinh Tran
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  6. Thanh Tan Vo
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  7. Mau Chien Dang
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  8. Sang Sub Kim
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  9. Jaichan Lee
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  10. Bach Thang Phan
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Correspondence to Bach Thang Phan.

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Le, T., Tran, H.C.S., Van Le, H. et al. Unipolar resistance switching characteristics in a thick ZnO/Cu/ZnO multilayer structure. Journal of the Korean Physical Society 60, 1087–1091 (2012). https://doi.org/10.3938/jkps.60.1087

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  • DOI: https://doi.org/10.3938/jkps.60.1087

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