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Using nonparametric goodness-of-fit tests to validate accelerated failure time models

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Optoelectronics, Instrumentation and Data Processing Aims and scope

Abstract

The construction of a reliability function from the results of accelerated failure time (AFT) models is considered. The constructed AFT models are verified by analyzing a sample of residuals. The fit of the residual sample to the baseline probability distribution is tested using modified nonparametric goodness-of-fit tests. In the absence of censoring in tests, it is proposed to use previously constructed models of distribution of statistics for testing composite hypotheses. In the case of censoring of type I or II, distributions of the goodness-of-fit test statistics are found by statistical modeling.

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Correspondence to E. V. Chimitova.

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Original Russian Text © N.S. Galanova, B.Yu. Lemeshko, E.V. Chimitova, 2012, published in Avtometriya, 2012, Vol. 48, No. 6, pp. 53–68.

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Galanova, N.S., Lemeshko, B.Y. & Chimitova, E.V. Using nonparametric goodness-of-fit tests to validate accelerated failure time models. Optoelectron.Instrument.Proc. 48, 580–592 (2012). https://doi.org/10.3103/S8756699012060064

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  • DOI: https://doi.org/10.3103/S8756699012060064

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