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XBIC using a laboratory X-ray source

  • Proceedings of the International Symposium “Nanophysics and Nanoelectronics”
  • Published:
Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

Results from using the current method, in which a current is induced by a focused X-ray beam (XBIC = X-ray beam induced current) on a laboratory source are presented. It is shown that by reducing the X-ray probe sizes and improving the resolution, there is a gain in contrast increase for obtained images of grain boundaries in a crystal.

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References

  1. Grigor’ev, M.V., Irzhak, D.V., Roshchupkin, D.V., Fakhrtdinov, R.R., and Yakimov, E.B., Trudy XV Mezhdunar. Simp. “Nanofizika i Nanoelektronika” (Proc. 15th Int. Symp. “Nanophysics and Nanoelectronics”), 2011, vol. 2, p. 600.

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  2. Fahrtdinov, R.R., Feklisova, O.V., Grigoriev, M.V., et al., Rev. Sci. Instrum., 2011, vol. 82, no. 9, p. 93702.

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Authors and Affiliations

  1. Institute of Microelectronics Technology and High-Purity Materials, Russian Academy of Sciences, Chernogolovka, 142432, Russia

    M. V. Grigoriev, R. R. Fakhrtdinov, D. V. Irzhak, D. V. Roshchupkin & E. B. Yakimov

Authors
  1. M. V. Grigoriev
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  2. R. R. Fakhrtdinov
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  3. D. V. Irzhak
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  4. D. V. Roshchupkin
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  5. E. B. Yakimov
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Corresponding author

Correspondence to M. V. Grigoriev.

Additional information

Original Russian Text © M.V. Grigoriev, R.R. Fakhrtdinov, D.V. Irzhak, D.V. Roshchupkin, E.B. Yakimov, 2013, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2013, Vol. 77, No. 1, pp. 26–28.

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Grigoriev, M.V., Fakhrtdinov, R.R., Irzhak, D.V. et al. XBIC using a laboratory X-ray source. Bull. Russ. Acad. Sci. Phys. 77, 21–23 (2013). https://doi.org/10.3103/S1062873813010127

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  • DOI: https://doi.org/10.3103/S1062873813010127

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