Abstract
In this paper we briefly discuss the current provisional temperature scale of 2000 (PLTS-2000) for low temperatures. Electronic thermometry is presented and discussed, focusing on its potential in verifying and realizing a future temperature scale. The discussion covers secondary thermometers such as NIS and SIS thermometers and noise, shot noise and Coulomb blockade primary thermometers. The last one is discussed in more detail.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Supplementary Information for the Realization of PLTS-2000, BIPM (2000) (www.bipm.org)
R.L. Rusby, B. Fellmuth, J. Engert, W.E. Fogle, E.D. Adams, L. Pitre, M. Durieux, J. Low Temp. Phys. 149, 156 (2007)
R.L. Rusby, M. Durieux, A.L. Reesink, R.P. Hudson, G. Schuster, M. Kühne, W.E. Fogle, R.J. Soulen, E.D. Adams, J. Low Temp. Phys. 126, 633 (2002)
R.L Rusby, M. Durieux, A.L. Reesink, R.P. Hudson, G. Schuster, M. Kühne, W.E. Fogle, R.J. Soulen, E.D. Adams, Proceedings of the 8th International Symposium on Temperature and Thermal Measurements in Industry and Science, edited by Fellmuth, Seidel and Scholtz (VDE Verlag GmbH, Berlin, 2001)
D.S. Greywall, P.A. Busch, J. Low Temp. Phys. 46, 451 (1982)
J. Fischer, S. Gerasimov, K.D. Hill, G. Machin, M. Moldover, L. Pitre, P. Steur, M. Stock, O. Tamura, H. Ugur, D.R. White, I. Yang, J. Zhang, CCT report TG-SI/docs-05, BIPM (2007) (www.bipm.org)
F. Pobell, Matter and Methods at Low Temperatures, 3rd ed. (Springer, 2007), p. 461
R.L. Rusby, R.P. Hudson, M. Durieux, K. Grohmann, H.-J. Jung, P.P.M. Steur, J.V. Nicholas, Metrologia 33, 409 (1996)
F. Giazotto, T.T. Heikkilä, A. Luukanen, A. Savin, J.P. Pekola, Rev. Mod. Phys. 78, 217 (2006)
J.M. Rowell, D.C. Tsui, Phys. Rev. B 14, 2456 (1976)
D.R. White, R. Galleano, A. Actis, H. Brixy, M. De Groot, J. Dubbeldam, A.L. Reesink, F. Edler, H. Sakurai, R.L. Shepard, J.C. Gallop, Metrologia 33, 325 (1996)
C.P. Lusher, J. Li, V.A. Maidanov, M.E. Digby, H. Dyball, A .Casey, J. Nyéki, V.V. Dmitriev, B.P. Cowan, J. Saunders, Meas. Sci. Technol. 12, 1 (2001)
L. Spietz, K.W. Lehnert, I. Siddiqi, R.J. Schoelkopf, Science 300, 1929 (2003)
L. Spietz, R.J. Schoelkopf, P. Pari, Appl. Phys. Lett. 89, 183123 (2006)
L. Spietz, Ph.D. thesis, The Shot Noise Thermometer, Yale University, 2006
J.P. Pekola, K.P. Hirvi, J.P. Kauppinen, M.A. Paalanen, Phys. Rev. Lett. 73, 2906 (1994)
J.P. Kauppinen, K.T. Loberg, A.J. Manninen, J.P. Pekola, R.A. Voutilainen, Rev. Sci. Inst. 69, 4166 (1998)
T. Bergsten, T. Claeson, P. Delsing, Appl. Phys. Lett. 78, 1264 (2001)
T. Holmqvist, J.P. Pekola, M. Meschke, J. Low Temp. Phys. 154, 172 (2009)
J.P. Pekola, T. Holmqvist, M. Meschke, Phys. Rev. Lett. 101, 206801 (2008)
F.C. Wellstood, C. Urbina, J. Clarke, Phys. Rev. B 49, 5942 (1994)
M. Meschke, J.P. Pekola, F. Gay, R.E. Rapp, H. Godfrin, J. Low Temp. Phys. 134, 1119 (2004)
P. Pekola, J.J. Toppari, J.P. Kauppinen, K.M. Kinnunen, A.J. Manninen, A.G.M. Jansen, J. Appl. Phys. 83, 5582 (1998)
J.P. Pekola, J.K. Suoknuuti, J.P. Kauppinen, M. Weiss, P.V.D. Linden, A.G.M. Jansen, J. Low Temp. Phys. 128, 263 (2002)
Sh. Farhangfar, K.P. Hirvi, J.P. Kauppinen, J.P. Pekola, J.J. Toppari, D.V. Averin, A.N. Korotkov, J. Low Temp. Phys. 108, 191 (1997)
K.P. Hirvi, J.P. Kauppinen, A.N. Korotkov, M.A. Paalanen, J.P. Pekola, Appl. Phys. Lett. 67, 2096 (1995)
T.A. Knuuttila, K.K. Nummila, W. Yao, J.P. Kauppinen, J.P. Pekola, Physica E 3, 224 (1998)
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Isosaari, E., Holmqvist, T., Meschke, M. et al. Thermometry by micro and nanodevices. Eur. Phys. J. Spec. Top. 172, 323–332 (2009). https://doi.org/10.1140/epjst/e2009-01057-y
Published:
Issue Date:
DOI: https://doi.org/10.1140/epjst/e2009-01057-y