Abstract
We have studied double-walled carbon nanotube (DWNT) irradiated by soft X-ray by Raman scattering spectroscopy and the spectral characteristics are compared to single-walled carbon nanotube (SWNT) irradiated under the same condition. We proved that DWNT is more stable for the X-ray induced defect formation than SWNT. Moreover, we found that the outer tube of DWNT was more sensitive on X-ray irradiation than the inner tube. The defect was recovered by annealing in Ar at lower temperature than that of SWNT. Based on these results, we inferred that X-ray irradiation leads to formation of interstitial-vacancy pairs, Frenkel defects, in carbon nanotube. The interstitial-vacancy separation on the inner tube of DWNT is conceivably shorter than that of the outer tube.
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Contribution to the Topical Issue “Excitonic Processes in Condensed Matter, Nanostructured and Molecular Materials”, edited by Maria Antonietta Loi, Jasper Knoester and Paul H. M. van Loosdrecht.
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Murakami, T., Asai, K., Yamamoto, Y. et al. X-ray irradiation effect of double walled carbon nanotube. Eur. Phys. J. B 86, 187 (2013). https://doi.org/10.1140/epjb/e2013-30591-8
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DOI: https://doi.org/10.1140/epjb/e2013-30591-8