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Precise half-life measurement of the 26Si ground state

  • Regular Article — Experimental Physics
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An Erratum to this article was published on 12 November 2008

Abstract

The β-decay half-life of 26Si was measured with a relative precision of 1.4·10−3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision of 3%. The experiment was done at the Accelerator Laboratory of the University of Jyväskylä where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.

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Author information

Author notes

  1. U. Hager

    Present address: TRIUMF, 4004 Wesbrook Mall, Vancouver, British Columbia, V6T 2A3, Canada

  2. T. Sonoda

    Present address: Instituut voor Kern-en Stralingsfysica, Celestijnenlaan 200D, B-3001, Leuven, Belgium

Authors and Affiliations

  1. Centre d’Études Nucléaires de Bordeaux Gradignan, Université Bordeaux 1-UMR 5797 CNRS/IN2P3, Chemin du Solarium, BP 120, F-33175, Gradignan Cedex, France

    I. Matea, J. Souin, B. Blank, J. Giovinazzo, J. Huikari & J. -L. Pedroza

  2. Instituto Estructura de la Materia, CSIC, Serrano 113bis, cE-28006, Madrid, Spain

    J. Souin

  3. Department of Physics, University of Jyväskylä, P.O. Box 35, FI-40014, Jyväskylä, Finland

    J. Äystö, V. -V. Elomaa, T. Eronen, U. Hager, J. Hakala, A. Jokinen, A. Kankainen, I. D. Moore, S. Rahaman, J. Rissanen, J. Ronkainen, A. Saastamoinen, T. Sonoda & C. Weber

  4. CERN, CH-1211, Geneva 23, Switzerland

    P. Delahaye

Authors
  1. I. Matea
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  2. J. Souin
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  3. J. Äystö
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  4. B. Blank
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  5. P. Delahaye
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  6. V. -V. Elomaa
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  7. T. Eronen
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  8. J. Giovinazzo
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  9. U. Hager
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  10. J. Hakala
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  11. J. Huikari
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  12. A. Jokinen
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  13. A. Kankainen
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  14. I. D. Moore
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  15. J. -L. Pedroza
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  16. S. Rahaman
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  17. J. Rissanen
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  18. J. Ronkainen
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  19. A. Saastamoinen
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  20. T. Sonoda
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  21. C. Weber
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Corresponding author

Correspondence to I. Matea.

Additional information

Communicated by D. Guerreau

An erratum to this article is available at http://dx.doi.org/10.1140/epja/i2008-10678-2.

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Matea, I., Souin, J., Äystö, J. et al. Precise half-life measurement of the 26Si ground state. Eur. Phys. J. A 37, 151–158 (2008). https://doi.org/10.1140/epja/i2008-10623-5

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  • DOI: https://doi.org/10.1140/epja/i2008-10623-5

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