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Anisotropy of diffraction characteristics of thin pyrolytic graphite films

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Abstract

We have studied polar diagrams and local diffraction characteristics of thin highly oriented pyrolytic graphite (HOPG) films used for X-ray monochromatization and spectrometry. The measurements have been performed on a two-wave X-ray reflectometer. The angular azimuthal scanning of initial HOPG films by a probe with a cross section below 0.1 mm2; the diffraction reflection coefficient exhibited a sharp anisotropy. It is shown that the effect of anisotropy can be suppressed and an HOPG film can be used as a dispersive element for X-ray tomography and mapping, as well as for studying spectra with a single pulse of an X-ray laser.

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Authors and Affiliations

  1. Lebedev Institute of Physics, Russian Academy of Sciences, Moscow, 119991, Russia

    A. G. Tur’yanskii, S. S. Gizha & V. M. Senkov

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  1. A. G. Tur’yanskii
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  2. S. S. Gizha
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  3. V. M. Senkov
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Correspondence to A. G. Tur’yanskii.

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Original Russian Text © A.G. Tur’yanskii, S.S. Gizha, V.M. Senkov, 2013, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2013, Vol. 39, No. 12, pp. 71–78.

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Tur’yanskii, A.G., Gizha, S.S. & Senkov, V.M. Anisotropy of diffraction characteristics of thin pyrolytic graphite films. Tech. Phys. Lett. 39, 573–575 (2013). https://doi.org/10.1134/S1063785013060254

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  • DOI: https://doi.org/10.1134/S1063785013060254

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