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The incorporation of SiO2 nanoparticles in poly(p-phenylenevinylene)(PPV) for PPV/SiO2 nanocomposite

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Abstract

The changes in surface morphology and current-voltage characteristics of poly(p-phenylenevinylene)(PPV) thin film has been studied by varying the amount of incorporated SiO2 nanoparticles. The electronic structure of carbon atom in PPV and PPV/SiO2 nanocomposite films was studied by using near-edge X-ray absorption fine structure. The surface morphology of PPV/SiO2 nanocomposite film was found to be greatly dependent on the amount of incorporated SiO2 nanoparticles. The current–voltage behavior of PPV/SiO2 nanocomposite film was mainly dependent on the surface morphology of the film. The excess content of SiO2 nanoparticles in PPV/SiO2 nanocomposite film was revealed to induce an agglomeration of SiO2 nanoparticles where blocking of electronic conduction happens.

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Acknowledgement

The authors acknowledge the support from ‘The National Program for 0.1 Terabit NVM Device’.

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Authors and Affiliations

  1. Department of Ceramic Engineering, Yonsei University, 134 Shinchon-Dong, Seodaemun-Ku, Seoul, 120-749, South Korea

    Sook Yoon, Ki Hyun Yoon & Hyung-Ho Park

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  1. Sook Yoon
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  2. Ki Hyun Yoon
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  3. Hyung-Ho Park
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Correspondence to Hyung-Ho Park.

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Yoon, S., Yoon, K.H. & Park, HH. The incorporation of SiO2 nanoparticles in poly(p-phenylenevinylene)(PPV) for PPV/SiO2 nanocomposite. J Electroceram 21, 752–756 (2008). https://doi.org/10.1007/s10832-007-9295-z

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  • DOI: https://doi.org/10.1007/s10832-007-9295-z

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