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Surface shape resonances of ridges on a thin film

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The European Physical Journal B - Condensed Matter and Complex Systems Aims and scope Submit manuscript

Abstract:

The spectrum of surface shape resonances associated with a finite number of ridges on one interface of an otherwise plane film is calculated. The frequencies are obtained numerically by solving the homogeneous integral equations which describe the electrostatic field in the vicinity of a surface defect. The calculations are performed for a surface with ridges with Gaussian, Lorentzian and sinusoidal profiles. The results show a strong dependence of the localized plasmon frequencies on the surface profile, on the distance between the ridges, and on the thickness of the film.

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Authors and Affiliations

  1. Department of Physics and Astronomy, University of Western Ontario London, N6A 3K7, Ontario, Canada

    J.M. Pereira

  2. Departamento de Física, Universidade Federal do Ceará,Campus do Pici,Centro de Ciências, Caixa Postal 6030, 60455-760, Ceará, Fortaleza, Brasil

    R.N. Costa Filho, V.N. Freire & G.A. Farias

Authors
  1. J.M. Pereira
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  2. R.N. Costa Filho
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  3. V.N. Freire
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  4. G.A. Farias
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Additional information

Received 5 April 1999 and Received in final form 6 July 1999

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Pereira, J., Costa Filho, R., Freire, V. et al. Surface shape resonances of ridges on a thin film. Eur. Phys. J. B 13, 589–593 (2000). https://doi.org/10.1007/s100510050072

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  • DOI: https://doi.org/10.1007/s100510050072

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