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The Carrier Statistics, Terahertz Frequency, Extremely Degenerate Opto-electronic Materials and All That

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Emerging Trends in Terahertz Engineering and System Technologies

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Abstract

In this chapter, we study the carrier statistics (CS) in quantized extremely degenerate III–V, ternary, quaternary and tetragonal compounds respectively. We have also investigated the influence of photo-excitation and electric field on the Fermi energy. We note by taking various types of opto-electronic materials as examples that the Fermi energy oscillates with inverse magnetic field due to SdH effect, changes with changing electric field, light intensity, wave length and alloy composition in different ways which are totally energy band constants dependent.

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Authors and Affiliations

  1. Department of Computer Science and Engineering, Institute of Engineering and Management & University of Engineering and Management, Kolkata, India

    R. Paul & S. Chakrabarti

  2. Department of Computer Science and Engineering, University of Engineering and Management and Institute of Engineering and Management, Kolkata and Jaipur Y-12, Sector-V, Salt Lake Electronics Complex, Kolkata, 700091 and Gurukul, Sikar Road NH 11, Near Udaipuria Mod, Jaipur, Rajasthan, 303807, India

    B. Chatterjee

  3. Department of Basic Science and Humanities, Institute of Engineering and Management & University of Engineering and Management, Kolkata, India

    P. K. Das, T. De & S. D. Biswas

  4. Department of Applied Physics, The University of Calcutta, 92 APC Road, Kolkata, India

    M. Mitra

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    Arindam Biswas

  2. Department of Physics, Bidhan Chandra College,, Asansol,, West Bengal, India

    Amit Banerjee

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    Aritra Acharyya

  4. Research Institute of Electronics, Shizuoka University, Shizuoka, Japan

    Hiroshi Inokawa

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Paul, R. et al. (2021). The Carrier Statistics, Terahertz Frequency, Extremely Degenerate Opto-electronic Materials and All That. In: Biswas, A., Banerjee, A., Acharyya, A., Inokawa, H. (eds) Emerging Trends in Terahertz Engineering and System Technologies. Springer, Singapore. https://doi.org/10.1007/978-981-15-9766-4_6

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