Abstract
In the microelectronics and pharmaceutical industries especially, particles microns in size and even smaller diminish the quality and quantity of the products produced. To reduce losses due to contamination, we need to detect particles in air, in other gases, and in liquids, as well as on surfaces. Various methods are discussed here. The methods using the scattering of light predominate currently.
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Cooper, D.W. (1989). Monitoring Contaminant Particles in Gases and Liquids: A Review. In: Mittal, K.L. (eds) Particles in Gases and Liquids 1. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0793-8_1
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DOI: https://doi.org/10.1007/978-1-4613-0793-8_1
Publisher Name: Springer, Boston, MA
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