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Application of the Naive Bayes Classifier to Defect Characterization Using Active Thermography

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Abstract

In the paper, a method for characterization of defects using active thermography and naive Bayes classifier is presented. Experimental investigations of the test sample are conducted with the stepped heating method. Two classifiers—with the parametric and non-parametric estimation of the features density distributions—are considered. Simulations are performed for three datasets representing three phases of the heat process occurring in the investigated sample.

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  1. Department of Electrical Engineering, Czestochowa University of Technology, 17 Armii Krajowej Ave., 42-200, Czestochowa, Poland

    Sebastian Dudzik

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  1. Sebastian Dudzik
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Correspondence to Sebastian Dudzik.

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Dudzik, S. Application of the Naive Bayes Classifier to Defect Characterization Using Active Thermography. J Nondestruct Eval 31, 383–392 (2012). https://doi.org/10.1007/s10921-012-0149-5

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  • DOI: https://doi.org/10.1007/s10921-012-0149-5

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